Inventor
FLACH BJOERN
DE4 patents
Patents
4 patentsUS7360139B2Apr 15, 2008
Semiconductor component, arrangement and method for characterizing a tester for semiconductor components
INFINEON TECHNOLOGIES AG7 citations68
US6777924B2Aug 17, 2004
Method and magazine device for testing semiconductor devices
INFINEON TECHNOLOGIES AG12 citations68
US7414421B2Aug 19, 2008
Insertable calibration device
INFINEON TECHNOLOGIES AG3 citations58
US7426669B2Sep 16, 2008
Circuit arrangement and method for driving electronic chips
INFINEON TECHNOLOGIES AG0 citations50