Inventor
SWINTON ALEXANDER J
US3 patents
Patents
3 patentsUS6069068AMay 30, 2000
Sub-quarter-micron copper interconnections with improved electromigration resistance and reduced defect sensitivity
IBM224 citations98
US6258710B1Jul 10, 2001
Sub-quarter-micron copper interconnections with improved electromigration resistance and reduced defect sensitivity
IBM39 citations92
US6037795AMar 14, 2000
Multiple device test layout
IBM29 citations89