Inventor
AN YOUNG-SOO
KR14 patents
⚠️ This page may combine multiple inventors who share the name “AN YOUNG-SOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
8 patentsUS6489790B1Dec 3, 2002
Socket including pressure conductive rubber and mesh for testing of ball grid array package
SAMSUNG ELECTRONICS CO LTD39 citations92
US7880490B2Feb 1, 2011
Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same
SAMSUNG ELECTRONICS CO LTD8 citations83
US8026733B2Sep 27, 2011
Interface structure of wafer test equipment
SAMSUNG ELECTRONICS CO LTD10 citations82
US7438563B2Oct 21, 2008
Connector for testing a semiconductor package
SAMSUNG ELECTRONICS CO LTD9 citations80
US7884628B2Feb 8, 2011
Interposer and probe card having the same
SAMSUNG ELECTRONICS CO LTD4 citations62
US6396294B2May 28, 2002
Socket pin and socket for electrical testing of semiconductor packages
SAMSUNG ELECTRONICS CO LTD6 citations60
US7786721B2Aug 31, 2010
Multilayer type test board assembly for high-precision inspection
SAMSUNG ELECTRONICS CO LTD1 citations51
US7538566B2May 26, 2009
Electrical test system including coaxial cables
SAMSUNG ELECTRONICS CO LTD0 citations41