Inventor

LOW CHEN NI

SG2 patents

Patents

2 patents

US7253606B2Aug 7, 2007

Framework that maximizes the usage of testhead resources in in-circuit test system

AGILENT TECHNOLOGIES INC10 citations77

US7089139B2Aug 8, 2006

Method and apparatus for configuration of automated debug of in-circuit tests

AGILENT TECHNOLOGIES INC9 citations65