Inventor
NAKAO TOSHIYUKI
JP42 patents
⚠️ This page may combine multiple inventors who share the name “NAKAO TOSHIYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
12 patentsUS8035808B2Oct 11, 2011
Surface defect inspection method and apparatus
HITACHI HIGH TECH CORP14 citations92
US7710557B2May 4, 2010
Surface defect inspection method and apparatus
HITACHI HIGH TECH CORP24 citations92
US7869024B2Jan 11, 2011
Method and its apparatus for inspecting defects
HITACHI HIGH TECH CORP11 citations84
US7719673B2May 18, 2010
Defect inspecting device for sample surface and defect detection method therefor
HITACHI HIGH TECH CORP10 citations84
US7675613B2Mar 9, 2010
Defect inspection method
HITACHI HIGH TECH CORP9 citations84
US7916288B2Mar 29, 2011
Defect inspection method
HITACHI HIGH TECH CORP4 citations74
US10254235B2Apr 9, 2019
Defect inspecting method and defect inspecting apparatus
HITACHI HIGH TECH CORP1 citations73
US7965386B2Jun 21, 2011
Method and its apparatus for inspecting defects
HITACHI HIGH TECH CORP2 citations63
US9841384B2Dec 12, 2017
Defect inspecting method and defect inspecting apparatus
HITACHI HIGH TECH CORP0 citations52
US9506872B2Nov 29, 2016
Inspection apparatus
HITACHI HIGH TECH CORP0 citations52
US9228960B2Jan 5, 2016
Defect inspecting method and defect inspecting apparatus
HITACHI HIGH TECH CORP0 citations52
US10352879B2Jul 16, 2019
X-ray inspection method and device
HITACHI HIGH TECH CORP0 citations41
AISIN SEIKI
5 patentsUS4653352AMar 31, 1987
Automatic transmission system for automobiles having hydraulic and electronic control systems
AISIN SEIKI71 citations94
US4138906AFeb 13, 1979
Power distributing apparatus for vehicles
AISIN SEIKI23 citations79
US4188838AFeb 19, 1980
Control apparatus of a transfer mechanism
AISIN SEIKI17 citations72
US4954122ASep 4, 1990
Differential gear apparatus with worm gears
AISIN SEIKI18 citations71
US4878400ANov 7, 1989
Bias ratio levelling apparatus of a worm gear type differential
AISIN SEIKI13 citations70
NAKAO TOSHIYUKI
5 patentsUS8638429B2Jan 28, 2014
Defect inspecting method and defect inspecting apparatus
NAKAO TOSHIYUKI5 citations83
US8670116B2Mar 11, 2014
Method and device for inspecting for defects
NAKAO TOSHIYUKI6 citations72
US8482727B2Jul 9, 2013
Defect inspection method
NAKAO TOSHIYUKI2 citations62
US8115915B2Feb 14, 2012
Defect inspection method and apparatus
NAKAO TOSHIYUKI2 citations62
US9041921B2May 26, 2015
Defect inspection device and defect inspection method
NAKAO TOSHIYUKI0 citations41
OSHIMA YOSHIMASA
5 patentsUS8264679B2Sep 11, 2012
Inspection apparatus
OSHIMA YOSHIMASA2 citations61
US8120766B2Feb 21, 2012
Inspection apparatus
OSHIMA YOSHIMASA1 citations61
US8934092B2Jan 13, 2015
Surface defect inspection method and apparatus
OSHIMA YOSHIMASA0 citations51
US8705026B2Apr 22, 2014
Inspection apparatus
OSHIMA YOSHIMASA0 citations51
US8400629B2Mar 19, 2013
Surface defect inspection method and apparatus
OSHIMA YOSHIMASA0 citations51
URANO YUTA
4 patentsUS8804110B2Aug 12, 2014
Fault inspection device and fault inspection method
URANO YUTA4 citations73
US8599369B2Dec 3, 2013
Defect inspection device and inspection method
URANO YUTA6 citations73
US8314929B2Nov 20, 2012
Method and its apparatus for inspecting defects
URANO YUTA5 citations73
US8477302B2Jul 2, 2013
Defect inspection apparatus
URANO YUTA4 citations62
HITACHI LTD
3 patentsHAMAMATSU AKIRA
3 patentsUS8144337B2Mar 27, 2012
Inspecting method and inspecting apparatus for substrate surface
HAMAMATSU AKIRA15 citations92
US8310665B2Nov 13, 2012
Inspecting method and inspecting apparatus for substrate surface
HAMAMATSU AKIRA9 citations84
US8654350B2Feb 18, 2014
Inspecting method and inspecting apparatus for substrate surface
HAMAMATSU AKIRA2 citations62