Inventor
MOCUTA ANDA C
US28 patents
⚠️ This page may combine multiple inventors who share the name “MOCUTA ANDA C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
20 patentsUS7723750B2May 25, 2010
MOSFET with super-steep retrograded island
IBM124 citations99
US6916698B2Jul 12, 2005
High performance CMOS device structure with mid-gap metal gate
IBM139 citations99
US6881635B1Apr 19, 2005
Strained silicon NMOS devices with embedded source/drain
IBM176 citations99
US7067400B2Jun 27, 2006
Method for preventing sidewall consumption during oxidation of SGOI islands
IBM62 citations96
US6762469B2Jul 13, 2004
High performance CMOS device structure with mid-gap metal gate
IBM68 citations96
US6303450B1Oct 16, 2001
CMOS device structures and method of making same
IBM67 citations96
US7705345B2Apr 27, 2010
High performance strained silicon FinFETs device and method for forming same
IBM52 citations93
US7268049B2Sep 11, 2007
Structure and method for manufacturing MOSFET with super-steep retrograded island
IBM21 citations92
US7056782B2Jun 6, 2006
CMOS silicide metal gate integration
IBM25 citations92
US6509241B2Jan 21, 2003
Process for fabricating an MOS device having highly-localized halo regions
IBM35 citations92
US6746924B1Jun 8, 2004
Method of forming asymmetric extension mosfet using a drain side spacer
IBM45 citations91
US7691698B2Apr 6, 2010
Pseudomorphic Si/SiGe/Si body device with embedded SiGe source/drain
IBM15 citations84
US7560326B2Jul 14, 2009
Silicon/silcion germaninum/silicon body device with embedded carbon dopant
IBM18 citations84
US6635517B2Oct 21, 2003
Use of disposable spacer to introduce gettering in SOI layer
IBM13 citations83
US7411227B2Aug 12, 2008
CMOS silicide metal gate integration
IBM7 citations73
US7879650B2Feb 1, 2011
Method of providing protection against charging damage in hybrid orientation transistors
IBM3 citations63
US8042070B2Oct 18, 2011
Methods and system for analysis and management of parametric yield
IBM3 citations62
US7655557B2Feb 2, 2010
CMOS silicide metal gate integration
IBM4 citations62
US7928513B2Apr 19, 2011
Protection against charging damage in hybrid orientation transistors
IBM0 citations52
US7492016B2Feb 17, 2009
Protection against charging damage in hybrid orientation transistors
IBM0 citations52