Inventor
ROSENWEIG MOSHE
IL7 patents
Patents
7 patentsUS11205119B2Dec 21, 2021
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD11 citations84
US12183066B2Dec 31, 2024
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD1 citations71
US11348001B2May 31, 2022
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD3 citations71
US11010665B2May 18, 2021
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD3 citations71
US9904995B2Feb 27, 2018
System and method for patch based inspection
APPLIED MATERIALS ISRAEL LTD2 citations71
US10229241B2Mar 12, 2019
System and method for design based inspection
APPLIED MATERIALS ISRAEL LTD0 citations44
US10055534B2Aug 21, 2018
System and method for design based inspection
APPLIED MATERIALS ISRAEL LTD0 citations44