Inventor

HIROSE TAKENORI

JP26 patents

⚠️ This page may combine multiple inventors who share the name “HIROSE TAKENORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HIROSE TAKENORI

HITACHI LTD

Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the same

Method and apparatus for measuring thickness of thin film and device manufacturing method using same

Polishing pad surface condition evaluation method and an apparatus thereof and a method of producing a semiconductor device

Method and apparatus for measuring thickness of thin film and device manufacturing method using same

Method and apparatus for managing surface image of thin film device, and method and apparatus for manufacturing thin film device using the same

Method of detecting and measuring endpoint of polishing processing and its apparatus and method of manufacturing semiconductor device using the same

Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the same

Method of polishing a film

HITACHI HIGH TECH CORP

Method and device for detecting shape of surface of medium

Spectroscopic measurement device

Method and apparatus for inspecting a pattern shape

Spectrometry apparatus

Cantilever, scanning probe microscope, and measurement method using scanning probe microscope

Thermally assisted magnetic recording head inspection method and apparatus

Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus

Pattern height measurement device and charged particle beam device

HIROSE TAKENORI

Method and apparatus for inspecting defects of patterns formed on a hard disk medium

Spectral detection method and device, and defect inspection method and apparatus using the same

Magnetic recording disk having aligning pattern and method for aligning thereof

SASAZAWA HIDEAKI

Method for defect determination in fine concave-convex pattern and method for defect determination on patterned medium

Scatterometry method and device for inspecting patterned medium

ZHANG KAIFENG

Cantilever for magnetic force microscope and method of manufacturing the same

Thermally assisted magnetic recording head inspection method and apparatus

HITACHI HIGH TECH FINE SYSTEMS CORP

Inspection method and its apparatus for thermal assist type magnetic head element

HITACHI KENKI FINE TECH CO LTD

Method and apparatus for measuring depth of holes formed on a specimen

SAITO KEIYA

Pattern shape inspection method and apparatus thereof