Inventor

IHM DONG CHUL

KR3 patents

Patents

3 patents

US11341305B2May 24, 2022

Method of predicting shape of semiconductor device

SAMSUNG ELECTRONICS CO LTD3 citations70

US8890069B2Nov 18, 2014

Method for detecting defect of substrate

SAMSUNG ELECTRONICS CO LTD1 citations42

US12540851B2Feb 3, 2026

Semiconductor device measuring device and method for measuring semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations40