Inventor
NABATOVA-GABAIN NATALIYA
JP9 patents
⚠️ This page may combine multiple inventors who share the name “NABATOVA-GABAIN NATALIYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HORIBA LTD
8 patentsUS7688446B2Mar 30, 2010
Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium
HORIBA LTD8 citations81
US7196793B2Mar 27, 2007
Method for analyzing thin-film layer structure using spectroscopic ellipsometer
HORIBA LTD14 citations81
US7280210B2Oct 9, 2007
Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program
HORIBA LTD7 citations71
US8013997B2Sep 6, 2011
Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium
HORIBA LTD2 citations60
US7271901B2Sep 18, 2007
Thin-film characteristic measuring method using spectroellipsometer
HORIBA LTD5 citations60
US7567872B2Jul 28, 2009
Film forming condition determination method, film forming method, and film structure manufacturing method
HORIBA LTD2 citations58
US7280208B2Oct 9, 2007
Optical characteristic analysis method, sample measuring apparatus and spectroscopic ellipsometer
HORIBA LTD6 citations58
US7167242B2Jan 23, 2007
Sample analysis method
HORIBA LTD4 citations57