Inventor
UNLU SELIM M
US4 patents
Patents
4 patentsUS10151680B2Dec 11, 2018
Nanoparticles for self referencing calibration
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Method and system for enhanced single particle reflectance imaging
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Dual-phase interferometry for charge modulation mapping in ICS
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US10175476B2Jan 8, 2019
Solid immersion microscopy system with deformable mirror for correction of aberrations
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