Inventor
PRATT DAVID S
US26 patents
⚠️ This page may combine multiple inventors who share the name “PRATT DAVID S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
17 patentsUS7800238B2Sep 21, 2010
Surface depressions for die-to-die interconnects and associated systems and methods
MICRON TECHNOLOGY INC19 citations92
US7531443B2May 12, 2009
Method and system for fabricating semiconductor components with through interconnects and back side redistribution conductors
MICRON TECHNOLOGY INC25 citations92
US8367471B2Feb 5, 2013
Semiconductor assemblies, stacked semiconductor devices, and methods of manufacturing semiconductor assemblies and stacked semiconductor devices
MICRON TECHNOLOGY INC6 citations84
US7952170B2May 31, 2011
System including semiconductor components having through interconnects and back side redistribution conductors
MICRON TECHNOLOGY INC8 citations84
US9711457B2Jul 18, 2017
Semiconductor devices with recessed interconnects
MICRON TECHNOLOGY INC2 citations73
US9209166B2Dec 8, 2015
Semiconductor assemblies, stacked semiconductor devices, and methods of manufacturing semiconductor assemblies and stacked semiconductor devices
MICRON TECHNOLOGY INC4 citations73
US11515204B2Nov 29, 2022
Methods for forming conductive vias, and associated devices and systems
MICRON TECHNOLOGY INC1 citations69
US8853868B2Oct 7, 2014
Semiconductor structures including sub-resolution alignment marks
MICRON TECHNOLOGY INC4 citations68
US7781868B2Aug 24, 2010
Semiconductor components having through interconnects and backside redistribution conductors
MICRON TECHNOLOGY INC3 citations62
US12387981B2Aug 12, 2025
Methods for forming conductive vias, and associated devices and systems
MICRON TECHNOLOGY INC0 citations59
US11990370B2May 21, 2024
Methods for forming conductive vias, and associated devices and systems
MICRON TECHNOLOGY INC0 citations59
US11574842B2Feb 7, 2023
Methods for forming conductive vias, and associated devices and systems
MICRON TECHNOLOGY INC0 citations58
US9842806B2Dec 12, 2017
Stacked semiconductor devices
MICRON TECHNOLOGY INC0 citations52
US8994163B2Mar 31, 2015
Semiconductor assemblies, stacked semiconductor devices, and methods of manufacturing semiconductor assemblies and stacked semiconductor devices
MICRON TECHNOLOGY INC0 citations52
US8766458B2Jul 1, 2014
Surface depressions for die-to-die interconnects and associated systems and methods
MICRON TECHNOLOGY INC0 citations52
US10020287B2Jul 10, 2018
Pass-through interconnect structure for microelectronic dies and associated systems and methods
MICRON TECHNOLOGY INC0 citations51
US11784077B2Oct 10, 2023
Wafer overlay marks, overlay measurement systems, and related methods
MICRON TECHNOLOGY INC0 citations49
PRATT DAVID S
7 patentsUS4249541AFeb 10, 1981
Biopsy device
PRATT DAVID S159 citations98
US8193092B2Jun 5, 2012
Semiconductor devices including a through-substrate conductive member with an exposed end and methods of manufacturing such semiconductor devices
PRATT DAVID S16 citations92
US8084854B2Dec 27, 2011
Pass-through 3D interconnect for microelectronic dies and associated systems and methods
PRATT DAVID S22 citations91
US8585915B2Nov 19, 2013
Methods for fabricating sub-resolution alignment marks on semiconductor structures
PRATT DAVID S5 citations79
US9209158B2Dec 8, 2015
Pass-through 3D interconnect for microelectronic dies and associated systems and methods
PRATT DAVID S4 citations71
US9054165B2Jun 9, 2015
Semiconductor devices including a through-substrate conductive member with an exposed end
PRATT DAVID S1 citations62
US8314497B2Nov 20, 2012
Surface depressions for die-to-die interconnects and associated systems
PRATT DAVID S1 citations62