Inventor
LU YEN-CHENG
TW77 patents
⚠️ This page may combine multiple inventors who share the name “LU YEN-CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
19 patentsUS9618837B2Apr 11, 2017
Extreme ultraviolet lithography process and mask with reduced shadow effect and enhanced intensity
TAIWAN SEMICONDUCTOR MFG CO LTD129 citations99
US9625824B2Apr 18, 2017
Extreme ultraviolet lithography collector contamination reduction
TAIWAN SEMICONDUCTOR MFG CO LTD30 citations93
US9488905B2Nov 8, 2016
Extreme ultraviolet lithography process and mask with reduced shadow effect and enhanced intensity
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US9678431B2Jun 13, 2017
EUV lithography system and method with optimized throughput and stability
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations83
US10162257B2Dec 25, 2018
Extreme ultraviolet lithography system, device, and method for printing low pattern density features
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9964850B2May 8, 2018
Method to mitigate defect printability for ID pattern
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9690186B2Jun 27, 2017
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9588419B2Mar 7, 2017
Extreme ultraviolet light (EUV) photomasks and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9535334B2Jan 3, 2017
Extreme ultraviolet lithography process to print low pattern density features
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9442384B2Sep 13, 2016
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11086227B2Aug 10, 2021
Method to mitigate defect printability for ID pattern
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US10976655B2Apr 13, 2021
Extreme ultraviolet lithography system, device, and method for printing low pattern density features
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US9733562B2Aug 15, 2017
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US9442387B2Sep 13, 2016
Extreme ultraviolet lithography process
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations63
US9417534B2Aug 16, 2016
Lithography method and structure for resolution enhancement with a two-state mask
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations63
US9405195B2Aug 2, 2016
Method to define multiple layer patterns with a single exposure by charged particle beam lithography
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US10691014B2Jun 23, 2020
Extreme ultraviolet lithography system, device, and method for printing low pattern density features
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10684552B2Jun 16, 2020
Method to mitigate defect printability for ID pattern
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9996013B2Jun 12, 2018
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
ARTILUX INC
13 patentsUS11105928B2Aug 31, 2021
Light-sensing apparatus and light-sensing method thereof
ARTILUX INC17 citations93
US11777049B2Oct 3, 2023
Photo-detecting apparatus with low dark current
ARTILUX INC6 citations86
US11652184B2May 16, 2023
Photo-detecting apparatus with low dark current
ARTILUX INC7 citations86
US11255724B2Feb 22, 2022
Photodetecting device for detecting different wavelengths
ARTILUX INC5 citations84
US12278252B2Apr 15, 2025
Photo-detecting apparatus with low dark current
ARTILUX INC2 citations74
US12013463B2Jun 18, 2024
Light-sensing apparatus and light-sensing method thereof
ARTILUX INC3 citations74
US11448830B2Sep 20, 2022
Photo-detecting apparatus with multi-reset mechanism
ARTILUX INC3 citations73
US11630212B2Apr 18, 2023
Light-sensing apparatus and light-sensing method thereof
ARTILUX INC3 citations72
US12256578B2Mar 18, 2025
Optical sensing apparatus
ARTILUX INC2 citations68
US12015384B2Jun 18, 2024
Photo-current amplification apparatus
ARTILUX INC0 citations63
US12196610B2Jan 14, 2025
Photodetecting device for detecting different wavelengths
ARTILUX INC0 citations62
US11686614B2Jun 27, 2023
Photodetecting device for detecting different wavelengths
ARTILUX INC0 citations62
US11574942B2Feb 7, 2023
Semiconductor device with low dark noise
ARTILUX INC1 citations62
TAIWAN SEMICONDUCTOR MFG
11 patentsUS8791024B1Jul 29, 2014
Method to define multiple layer patterns using a single exposure
TAIWAN SEMICONDUCTOR MFG31 citations93
US9081312B2Jul 14, 2015
Method to define multiple layer patterns with a single exposure by E-beam lithography
TAIWAN SEMICONDUCTOR MFG7 citations84
US9075313B2Jul 7, 2015
Multiple exposures in extreme ultraviolet lithography
TAIWAN SEMICONDUCTOR MFG9 citations84
US9261774B2Feb 16, 2016
Extreme ultraviolet lithography process and mask with reduced shadow effect and enhanced intensity
TAIWAN SEMICONDUCTOR MFG4 citations73
US9229326B2Jan 5, 2016
Method for integrated circuit patterning
TAIWAN SEMICONDUCTOR MFG4 citations73
US9377696B2Jun 28, 2016
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG2 citations63
US9223197B2Dec 29, 2015
Lithography and mask for resolution enhancement
TAIWAN SEMICONDUCTOR MFG2 citations63
US9182659B2Nov 10, 2015
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG1 citations63
US9146459B2Sep 29, 2015
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG1 citations63
US9122166B2Sep 1, 2015
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG2 citations63
US9034569B2May 19, 2015
Extreme ultraviolet lithography process and mask
TAIWAN SEMICONDUCTOR MFG2 citations63
LU YEN-CHENG
3 patentsUS8828625B2Sep 9, 2014
Extreme ultraviolet lithography mask and multilayer deposition method for fabricating same
LU YEN-CHENG301 citations98
US8785084B2Jul 22, 2014
Method for mask fabrication and repair
LU YEN-CHENG84 citations97
US8628897B1Jan 14, 2014
Extreme ultraviolet lithography process and mask
LU YEN-CHENG97 citations97
YU SHINN-SHENG
1 patentSHIH CHIA-TSUNG
1 patentSUZHOU METABRAIN INTELLIGENT TECHNOLOGY CO LTD
1 patentUNIV NAT TAIWAN
1 patentShowing the top 50 of 77 patents by PatentIndex Score.