P

Inventor

LU YEN-CHENG

TW77 patents
⚠️ This page may combine multiple inventors who share the name “LU YEN-CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

19 patents
US9618837B2Apr 11, 2017

Extreme ultraviolet lithography process and mask with reduced shadow effect and enhanced intensity

TAIWAN SEMICONDUCTOR MFG CO LTD129 citations99
US9625824B2Apr 18, 2017

Extreme ultraviolet lithography collector contamination reduction

TAIWAN SEMICONDUCTOR MFG CO LTD30 citations93
US9488905B2Nov 8, 2016

Extreme ultraviolet lithography process and mask with reduced shadow effect and enhanced intensity

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US9678431B2Jun 13, 2017

EUV lithography system and method with optimized throughput and stability

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations83
US10162257B2Dec 25, 2018

Extreme ultraviolet lithography system, device, and method for printing low pattern density features

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9964850B2May 8, 2018

Method to mitigate defect printability for ID pattern

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9690186B2Jun 27, 2017

Extreme ultraviolet lithography process and mask

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9588419B2Mar 7, 2017

Extreme ultraviolet light (EUV) photomasks and fabrication methods thereof

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9535334B2Jan 3, 2017

Extreme ultraviolet lithography process to print low pattern density features

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9442384B2Sep 13, 2016

Extreme ultraviolet lithography process and mask

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11086227B2Aug 10, 2021

Method to mitigate defect printability for ID pattern

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US10976655B2Apr 13, 2021

Extreme ultraviolet lithography system, device, and method for printing low pattern density features

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US9733562B2Aug 15, 2017

Extreme ultraviolet lithography process and mask

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US9442387B2Sep 13, 2016

Extreme ultraviolet lithography process

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations63
US9417534B2Aug 16, 2016

Lithography method and structure for resolution enhancement with a two-state mask

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations63
US9405195B2Aug 2, 2016

Method to define multiple layer patterns with a single exposure by charged particle beam lithography

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US10691014B2Jun 23, 2020

Extreme ultraviolet lithography system, device, and method for printing low pattern density features

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10684552B2Jun 16, 2020

Method to mitigate defect printability for ID pattern

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9996013B2Jun 12, 2018

Extreme ultraviolet lithography process and mask

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52

ARTILUX INC

13 patents

TAIWAN SEMICONDUCTOR MFG

11 patents

LU YEN-CHENG

3 patents

YU SHINN-SHENG

1 patent

SHIH CHIA-TSUNG

1 patent

SUZHOU METABRAIN INTELLIGENT TECHNOLOGY CO LTD

1 patent

UNIV NAT TAIWAN

1 patent

Showing the top 50 of 77 patents by PatentIndex Score.