Inventor
REDLARSKI LUKASZ
NE4 patents
Patents
4 patentsUS9568304B2Feb 14, 2017
Image sequence and evaluation method and system for structured illumination microscopy
MITUTOYO CORP8 citations77
US11587246B2Feb 21, 2023
Metrology system with projected pattern for points-from-focus type processes
MITUTOYO CORP1 citations57
US11530914B2Dec 20, 2022
Shape measuring method
MITUTOYO CORP0 citations48
US11493330B2Nov 8, 2022
Method for measuring a height map of a test surface
MITUTOYO CORP0 citations39