Inventor
KAWANO HAJIME
JP86 patents
⚠️ This page may combine multiple inventors who share the name “KAWANO HAJIME”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
28 patentsUS9236220B2Jan 12, 2016
Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscope
HITACHI HIGH TECH CORP8 citations84
US9177759B2Nov 3, 2015
Processing apparatus and method using a scanning electron microscope
HITACHI HIGH TECH CORP16 citations84
US8618499B1Dec 31, 2013
Electron beam irradiation apparatus
HITACHI HIGH TECH CORP6 citations84
US10720306B2Jul 21, 2020
Charged particle beam device
HITACHI HIGH TECH CORP4 citations83
US10249474B2Apr 2, 2019
Charged particle beam device
HITACHI HIGH TECH CORP4 citations83
US9697987B2Jul 4, 2017
Charged particle beam device
HITACHI HIGH TECH CORP9 citations83
US8890096B2Nov 18, 2014
Measuring/inspecting apparatus and measuring/inspecting method enabling blanking control of electron beam
HITACHI HIGH TECH CORP8 citations82
US11062892B2Jul 13, 2021
Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometer
HITACHI HIGH TECH CORP3 citations73
US10546718B2Jan 28, 2020
High voltage power supply device and charged particle beam device
HITACHI HIGH TECH CORP2 citations73
US10134558B2Nov 20, 2018
Scanning electron microscope
HITACHI HIGH TECH CORP2 citations73
US9679740B2Jun 13, 2017
Charged particle beam device
HITACHI HIGH TECH CORP2 citations73
US9543053B2Jan 10, 2017
Electron beam equipment
HITACHI HIGH TECH CORP3 citations73
US9368324B2Jun 14, 2016
Measurement and inspection device
HITACHI HIGH TECH CORP4 citations73
US9336984B2May 10, 2016
Charged particle beam device and measuring method using the same
HITACHI HIGH TECH CORP6 citations73
US9053905B2Jun 9, 2015
Electron beam irradiation apparatus
HITACHI HIGH TECH CORP4 citations73
US11133147B2Sep 28, 2021
Charged particle ray device and cross-sectional shape estimation program
HITACHI HIGH TECH CORP2 citations72
US10903037B2Jan 26, 2021
Charged particle beam device
HITACHI HIGH TECH CORP2 citations72
US10818470B2Oct 27, 2020
Charged particle beam device
HITACHI HIGH TECH CORP2 citations72
US9978558B2May 22, 2018
Scanning-electron-microscope image processing device and scanning method
HITACHI HIGH TECH CORP4 citations72
US9644955B2May 9, 2017
Scanning electron beam device with focus adjustment based on acceleration voltage and dimension measurement method using same
HITACHI HIGH TECH CORP2 citations72
US9520266B2Dec 13, 2016
Pattern critical dimension measurement equipment and method for measuring pattern critical dimension
HITACHI HIGH TECH CORP4 citations72
US10121634B2Nov 6, 2018
Charged particle beam device and charged particle beam measurement method
HITACHI HIGH TECH CORP2 citations71
US12394586B2Aug 19, 2025
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US12205790B2Jan 21, 2025
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US12125667B2Oct 22, 2024
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US12057288B2Aug 6, 2024
Charged particle beam device and inspection method
HITACHI HIGH TECH CORP0 citations62
US11798780B2Oct 24, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US11239052B2Feb 1, 2022
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
HITACHI MEDICAL CORP
9 patentsUS6781492B2Aug 24, 2004
Superconducting magnetic apparatus
HITACHI MEDICAL CORP18 citations92
US6600318B1Jul 29, 2003
Open MRI system with a vertical static field and an imaging volume closer to the lower than to the upper magnet assembly
HITACHI MEDICAL CORP19 citations92
US6580346B1Jun 17, 2003
Magnetic resonance imaging apparatus
HITACHI MEDICAL CORP34 citations92
US6437672B1Aug 20, 2002
Superconducting magnetic device
HITACHI MEDICAL CORP26 citations92
US5936498AAug 10, 1999
Superconducting magnet apparatus and magnetic resonance imaging system using the same
HITACHI MEDICAL CORP29 citations92
US6037850AMar 14, 2000
Superconducting magnet apparatus and method of regulating magnetization thereof
HITACHI MEDICAL CORP35 citations91
US5633588AMay 27, 1997
Superconducting magnet apparatus using superconducting multilayer composite member, method of magnetizing the same and magnetic resonance imaging system employing the same
HITACHI MEDICAL CORP50 citations90
US6853281B1Feb 8, 2005
Magnet apparatus and mri apparatus
HITACHI MEDICAL CORP19 citations83
US6816047B2Nov 9, 2004
Magnetic resonance imaging apparatus
HITACHI MEDICAL CORP5 citations63
HITACHI LTD
4 patentsUS6541784B1Apr 1, 2003
Electron beam exposure system and exposing method using an electron beam
HITACHI LTD20 citations93
US6828573B1Dec 7, 2004
Electron beam lithography system
HITACHI LTD24 citations89
US6674086B2Jan 6, 2004
Electron beam lithography system, electron beam lithography apparatus, and method of lithography
HITACHI LTD28 citations89
US6831283B2Dec 14, 2004
Charged particle beam drawing apparatus and pattern forming method
HITACHI LTD7 citations74
PANASONIC CORP
3 patentsKITANO YUKIHIKO
2 patentsOTAKA TADASHI
1 patentMATSUSHITA ELECTRIC INDUSTRIAL CO LTD
1 patentKAWANO HAJIME
1 patentMITSUBISHI ELECTRIC CORP
1 patentShowing the top 50 of 86 patents by PatentIndex Score.