Inventor
SHIM KEON SOO
KR24 patents
⚠️ This page may combine multiple inventors who share the name “SHIM KEON SOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SK HYNIX INC
12 patentsUS9384846B1Jul 5, 2016
Semiconductor memory device, memory system including the same, and operating method thereof
SK HYNIX INC23 citations90
US9424935B2Aug 23, 2016
Semiconductor device
SK HYNIX INC12 citations84
US9053796B2Jun 9, 2015
Semiconductor device and methods of manufacturing and operating the same
SK HYNIX INC5 citations84
US9853041B2Dec 26, 2017
Semiconductor device and methods of manufacturing and operating the same
SK HYNIX INC4 citations73
US9384841B2Jul 5, 2016
Semiconductor device, semiconductor system having the same and operating method thereof
SK HYNIX INC6 citations73
US9627078B2Apr 18, 2017
Semiconductor device and operating method thereof
SK HYNIX INC3 citations71
US9396799B2Jul 19, 2016
Semiconductor memory device improving threshold voltage of unselected memory block and method of operating the same
SK HYNIX INC2 citations62
US11880582B2Jan 23, 2024
Memory device having improved program and erase operations and operating method of the memory device
SK HYNIX INC0 citations59
US10950306B2Mar 16, 2021
Memory device having improved program and erase operations and operating method of the memory device
SK HYNIX INC0 citations59
US12538487B2Jan 27, 2026
Semiconductor memory device
SK HYNIX INC1 citations58
US9711517B2Jul 18, 2017
Memory device having a pipe transistor and sub-pipe gate materials with different oxidation rates
SK HYNIX INC0 citations51
US9620224B2Apr 11, 2017
Semiconductor device and operating method thereof
SK HYNIX INC0 citations50
HYNIX SEMICONDUCTOR INC
8 patentsUS6455374B1Sep 24, 2002
Method of manufacturing flash memory device
HYNIX SEMICONDUCTOR INC24 citations92
US7518931B2Apr 14, 2009
Method of monitoring an erase threshold voltage distribution in a NAND flash memory device
HYNIX SEMICONDUCTOR INC16 citations84
US7773429B2Aug 10, 2010
Non-volatile memory device and driving method thereof
HYNIX SEMICONDUCTOR INC16 citations82
US7889557B2Feb 15, 2011
NAND flash memory device with increased spacing between selection transistors and adjacent memory cells
HYNIX SEMICONDUCTOR INC9 citations80
US6697288B2Feb 24, 2004
Bit line voltage regulation circuit
HYNIX SEMICONDUCTOR INC10 citations72
US7567459B2Jul 28, 2009
Method of measuring a channel boosting voltage in a NAND flash memory device
HYNIX SEMICONDUCTOR INC2 citations62
US7268040B2Sep 11, 2007
Method of manufacturing a select transistor in a NAND flash memory
HYNIX SEMICONDUCTOR INC2 citations62
US6743676B2Jun 1, 2004
Method of forming a floating gate in a flash memory device
HYNIX SEMICONDUCTOR INC6 citations62