Inventor
HSUEH PEI-YING
TW7 patents
Patents
7 patentsUS11287472B2Mar 29, 2022
Chip and testing method thereof
REALTEK SEMICONDUCTOR CORP0 citations56
US12320849B2Jun 3, 2025
Clock control circuit and method
REALTEK SEMICONDUCTOR CORP0 citations49
US9983264B2May 29, 2018
Multiple defect diagnosis method and machine readable media
REALTEK SEMICONDUCTOR CORP0 citations44
US11774497B2Oct 3, 2023
Isolation circuit having test mechanism and test method thereof
REALTEK SEMICONDUCTOR CORP0 citations43
US12320847B2Jun 3, 2025
Test device for testing on-chip clock controller having debug function
REALTEK SEMICONDUCTOR CORP0 citations42
US10698029B2Jun 30, 2020
Chip
REALTEK SEMICONDUCTOR CORP0 citations35
US9213799B2Dec 15, 2015
Systematic defect analysis method and machine readable media
REALTEK SEMICONDUCTOR CORP0 citations33