Inventor

LOU CHOON LEONG

TW53 patents

⚠️ This page may combine multiple inventors who share the name “LOU CHOON LEONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LOU CHOON LEONG

TECAT TECH SUZHOU LIMITED

Probing device

Semiconductor structure comprising heat dissipation member

Testing device and probe elements thereof

Probe card device and testing equipment thereof

High speed signal transmitting and receiving detection device

Probing system

Shielding for probing system

Probe card structure including probe sets with different lengths

Probe device

Probe card device

Probe and elastic structure thereof

Test device

Probe card device having a probe structure with a protrusion portion

Probe card structure

STAR TECH INC

Probing apparatus and method of operating the same

Method of testing and analyzing display panel

Probe card and thermal conduction device thereof

Probing device

Test apparatus and jumper thereof

Method of operating a probing apparatus

Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test

Switching matrix system and operating method thereof for semiconductor characteristic measurement

Testing apparatus

Probing apparatus with temperature-adjusting mechanism

Testing apparatus, holding assembly, and probe card carrier

Testing device

Test assembly and method of manufacturing the same

STAR TECHN INC

Probe card for electrical testing a chip in a wide temperature range

Semiconductor devices testing apparatus with temperature-adjusting design

Integrated circuit probing apparatus having a temperature-adjusting mechanism

Apparatus for probing multiple integrated circuit devices

Probe card with tunable stage and at least one replaceable probe

Probe card

Vertical probe comprising slots and probe card for integrated circuit devices using the same

Low temperature probing apparatus

Integrated circuit probing apparatus having a temperature-adjusting mechanism

Heating apparatus for semiconductor devices

LOU CHOON LEONG

Probing apparatus with multiaxial stages for testing semiconductor devices

High-precision semiconductor device probing apparatus and system thereof

Probe card for testing high-frequency signals

Heat sink and integrated circuit assembly using the same

Enclosed probe station

Testing apparatus for light-emitting devices with a design for a removable sensing module

Switching matrix and testing system for semiconductor characteristic measurement using the same

STAR TECH WUHAN CO LTD

Light guiding device and light guiding device applied to silicon photonics structure

Probe testing device having elastic structure

Alignment method and alignment device

XINGR TECH ZHEJIANG LIMITED

Wafer testing cassette

XINGR HOLDINGS PTE LTD

Guide plate structure having guide plates with through holes and probe array having guide plate structure

VUETTE PTE LTD

Probe array and probe structure