Inventor

PAGANI ALBERTO

IT137 patents

⚠️ This page may combine multiple inventors who share the name “PAGANI ALBERTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PAGANI ALBERTO

ST MICROELECTRONICS SRL

Electronic devices with extended metallization layer on a passivation layer

Pressure sensing device with cavity and related methods

Tensile stress measurement device with attachment plates and related methods

System for electrical testing of through silicon vias (TSVs)

Pressure sensor with testing device and related methods

Integrated pressure sensor with double measuring scale, pressure measuring device including the integrated pressure sensor, braking system, and method of measuring a pressure using the integrated pressure sensor

Integrated electronic device with transceiving antenna and magnetic interconnection

Package, made of building material, for a parameter monitoring device, within a solid structure, and relative device

Integrated electronic device for monitoring pressure within a solid structure

Signal transmission through LC resonant circuits

Integrated electronic device for monitoring mechanical stress within a solid structure

Circuit architecture for the parallel supplying during electric or electromagnetic testing of a plurality of electronic devices integrated on a semiconductor wafer

Testing integrated circuits using few test probes

Testing integrated circuits

Crosstalk suppression in wireless testing of semiconductor devices

Block made of a building material

Pressure sensor with testing device and related methods

Testing architecture of circuits integrated on a wafer

Network of electronic devices assembled on a flexible support and communication method

Electronic system having increased coupling by using horizontal and vertical communication channels

Integrated circuit comprising at least an integrated antenna

Integrated electronic device with transceiving antenna and magnetic interconnection

Electronic system having increased coupling by using horizontal and vertical communication channels

Sensing structure of alignment of a probe for testing integrated circuits

Network of electronic devices assembled on a flexible support and communication method

Testing architecture of circuits integrated on a wafer

Semiconductor electronic device with improved testing features and corresponding packaging method

Integrated electronic device for monitoring humidity and/or corrosion

Pressure sensing device with cavity and related methods

IC with insulating trench and related methods

Electromagnetic shield for testing integrated circuits

System and method for electrical testing of through silicon vias (TSVs)

Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic device

Tensile stress measurement device with attachment plates and related methods

Method and apparatus for tuning a resonant circuit using a laser

Network of electronic devices assembled on a flexible support and communication method

Testing integrated circuits using few test probes

Packaged electronic device with integrated electronic circuits having transceiving antennas

PAGANI ALBERTO

Testing architecture of circuits integrated on a wafer

Traceable integrated circuits and production method thereof

Integrated circuit comprising at least an integrated antenna

Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic device

Sensing structure of alignment of a probe for testing integrated circuits

Electronic communications device with antenna and electromagnetic shield

System and method for electrical testing of through silicon vias (TSVs)

Method for performing an electrical testing of electronic devices

Electromagnetic shield for testing integrated circuits

Signal transmission through LC resonant circuits

Inductive connection structure for use in an integrated circuit

CANEGALLO ROBERTO

Active probe card for electrical wafer sort of integrated circuits