P

Inventor

LEE DONGGUN

KR22 patents
⚠️ This page may combine multiple inventors who share the name “LEE DONGGUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

14 patents
US11747289B2Sep 5, 2023

System of measuring image of pattern in high NA scanning-type EUV mask

SAMSUNG ELECTRONICS CO LTD2 citations72
US11935910B2Mar 19, 2024

Semiconductor light-emitting device with groove and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD5 citations70
US9466490B2Oct 11, 2016

Beam shapers, annealing systems employing the same, methods of heat treating substrates and methods of fabricating semiconductor devices

SAMSUNG ELECTRONICS CO LTD4 citations70
US7629087B2Dec 8, 2009

Photomask, method of making a photomask and photolithography method and system using the same

SAMSUNG ELECTRONICS CO LTD4 citations54
US11914282B2Feb 27, 2024

System of measuring image of pattern in scanning type EUV mask

SAMSUNG ELECTRONICS CO LTD0 citations51
US11619876B1Apr 4, 2023

System of inspecting pattern defect in scanning-type reflective extreme ultraviolet mask

SAMSUNG ELECTRONICS CO LTD0 citations51
US12527127B2Jan 13, 2026

Nitride semiconductor light emitting device

SAMSUNG ELECTRONICS CO LTD0 citations49
US12027107B2Jul 2, 2024

Display apparatus

SAMSUNG ELECTRONICS CO LTD0 citations49
US12218274B2Feb 4, 2025

Semiconductor light emitting device and display apparatus

SAMSUNG ELECTRONICS CO LTD0 citations48
US11742469B2Aug 29, 2023

Semiconductor light-emitting device and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD0 citations48
US12324277B2Jun 3, 2025

Nitride semiconductor light emitting device and display device using the same

SAMSUNG ELECTRONICS CO LTD0 citations47
US12125942B2Oct 22, 2024

Semiconductor light emitting devices

SAMSUNG ELECTRONICS CO LTD0 citations47
US11784285B2Oct 10, 2023

Three dimensionally structured semiconductor light emitting diode and display apparatus

SAMSUNG ELECTRONICS CO LTD0 citations47
US12332186B2Jun 17, 2025

Method and system for inspecting semiconductor wafer and method of fabricating semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD0 citations44

LG DISPLAY CO LTD

5 patents

KIM SANGHYUN

1 patent

JUNG YONGSEOK

1 patent

PARK JONGJU

1 patent