Inventor
RATNAM SAMPATH K
US150 patents
⚠️ This page may combine multiple inventors who share the name “RATNAM SAMPATH K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
49 patentsUS10553290B1Feb 4, 2020
Read disturb scan consolidation
MICRON TECHNOLOGY INC18 citations94
US10359933B2Jul 23, 2019
Memory devices and electronic systems having a hybrid cache including static and dynamic caches with single and multiple bits per cell, and related methods
MICRON TECHNOLOGY INC19 citations94
US9921898B1Mar 20, 2018
Identifying asynchronous power loss
MICRON TECHNOLOGY INC22 citations94
US9697134B2Jul 4, 2017
Memory having a static cache and a dynamic cache
MICRON TECHNOLOGY INC10 citations92
US11410734B1Aug 9, 2022
Voltage bin selection for blocks of a memory device after power up of the memory device
MICRON TECHNOLOGY INC8 citations86
US11256620B1Feb 22, 2022
Cache management based on memory device over-provisioning
MICRON TECHNOLOGY INC8 citations86
US10540228B2Jan 21, 2020
Providing data of a memory system based on an adjustable error rate
MICRON TECHNOLOGY INC5 citations84
US10509722B2Dec 17, 2019
Memory device with dynamic cache management
MICRON TECHNOLOGY INC4 citations84
US10380018B2Aug 13, 2019
Garbage collection
MICRON TECHNOLOGY INC6 citations84
US10318378B2Jun 11, 2019
Redundant array of independent NAND for a three-dimensional memory array
MICRON TECHNOLOGY INC9 citations84
US10083119B2Sep 25, 2018
Memory having a static cache and a dynamic cache
MICRON TECHNOLOGY INC7 citations84
US10078546B2Sep 18, 2018
Temperature related error management
MICRON TECHNOLOGY INC11 citations84
US9864697B2Jan 9, 2018
Memory having a static cache and a dynamic cache
MICRON TECHNOLOGY INC8 citations84
US10732890B2Aug 4, 2020
Adjusting a parameter for a programming operation based on the temperature of a memory system
MICRON TECHNOLOGY INC5 citations83
US9298545B2Mar 29, 2016
Data protection across multiple memory blocks
MICRON TECHNOLOGY INC11 citations83
US9236133B2Jan 12, 2016
Adjusted read for partially programmed block
MICRON TECHNOLOGY INC13 citations82
US9230688B2Jan 5, 2016
Determining an age of data stored in memory
MICRON TECHNOLOGY INC8 citations82
US9728278B2Aug 8, 2017
Threshold voltage margin analysis
MICRON TECHNOLOGY INC10 citations81
US9431121B2Aug 30, 2016
Read voltage adjustment
MICRON TECHNOLOGY INC11 citations79
US11676664B2Jun 13, 2023
Voltage bin selection for blocks of a memory device after power up of the memory device
MICRON TECHNOLOGY INC4 citations75
US11593005B2Feb 28, 2023
Managing voltage bin selection for blocks of a memory device
MICRON TECHNOLOGY INC4 citations75
US11709727B2Jul 25, 2023
Managing error-handling flows in memory devices
MICRON TECHNOLOGY INC3 citations73
US11593261B2Feb 28, 2023
Memory device with dynamic cache management
MICRON TECHNOLOGY INC1 citations73
US11587639B2Feb 21, 2023
Voltage calibration scans to reduce memory device overhead
MICRON TECHNOLOGY INC2 citations73
US11456051B1Sep 27, 2022
Optimized storage charge loss management
MICRON TECHNOLOGY INC2 citations73
US11163488B2Nov 2, 2021
Extended cross-temperature handling in a memory sub-system
MICRON TECHNOLOGY INC3 citations73
US11158392B2Oct 26, 2021
Operation of mixed mode blocks
MICRON TECHNOLOGY INC2 citations73
US11137808B2Oct 5, 2021
Temperature compensation in a memory system
MICRON TECHNOLOGY INC2 citations73
US11093385B2Aug 17, 2021
Memory device with dynamic cache management
MICRON TECHNOLOGY INC2 citations73
US11042306B2Jun 22, 2021
Memory management
MICRON TECHNOLOGY INC4 citations73
US10977173B2Apr 13, 2021
Memory device with dynamic storage mode control
MICRON TECHNOLOGY INC3 citations73
US10942796B2Mar 9, 2021
Identifying asynchronous power loss
MICRON TECHNOLOGY INC3 citations73
US10915444B2Feb 9, 2021
Garbage collection candidate selection using block overwrite rate
MICRON TECHNOLOGY INC3 citations73
US10915400B1Feb 9, 2021
Dynamic over provisioning allocation for purposed blocks
MICRON TECHNOLOGY INC3 citations73
US10761727B2Sep 1, 2020
Scan frequency modulation based on memory density or block usage
MICRON TECHNOLOGY INC2 citations73
US10671298B2Jun 2, 2020
Storing page write attributes
MICRON TECHNOLOGY INC3 citations73
US10579468B2Mar 3, 2020
Temperature related error management
MICRON TECHNOLOGY INC3 citations73
US10579537B2Mar 3, 2020
Memory having a static cache and a dynamic cache
MICRON TECHNOLOGY INC1 citations73
US10452282B2Oct 22, 2019
Memory management
MICRON TECHNOLOGY INC3 citations73
US10340016B2Jul 2, 2019
Methods of error-based read disturb mitigation and memory devices utilizing the same
MICRON TECHNOLOGY INC2 citations73
US10325668B2Jun 18, 2019
Operation of mixed mode blocks
MICRON TECHNOLOGY INC2 citations73
US10303535B2May 28, 2019
Identifying asynchronous power loss
MICRON TECHNOLOGY INC3 citations73
US10223259B1Mar 5, 2019
Memory device with dynamic storage mode control
MICRON TECHNOLOGY INC3 citations73
US11507304B1Nov 22, 2022
Diagonal page mapping in memory systems
MICRON TECHNOLOGY INC2 citations72
US11393548B2Jul 19, 2022
Workload adaptive scans for memory sub-systems
MICRON TECHNOLOGY INC2 citations72
US11188459B2Nov 30, 2021
Data block switching at a memory sub-system
MICRON TECHNOLOGY INC2 citations72
US10936392B2Mar 2, 2021
Read window size
MICRON TECHNOLOGY INC3 citations72
US10871923B2Dec 22, 2020
Management of program suspend and resume operations of a memory sub-system
MICRON TECHNOLOGY INC2 citations72
US11461158B2Oct 4, 2022
Granular error reporting on multi-pass programming of non-volatile memory
MICRON TECHNOLOGY INC2 citations71
RATNAM SAMPATH K
1 patentShowing the top 50 of 150 patents by PatentIndex Score.