Inventor
NAKANO HIROYUKI
JP174 patents
⚠️ This page may combine multiple inventors who share the name “NAKANO HIROYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
13 patentsUS5500756AMar 19, 1996
Optical fiber transmission system and supervision method of the same
HITACHI LTD183 citations97
US5831754ANov 3, 1998
Optical amplifier
HITACHI LTD42 citations96
US5555477ASep 10, 1996
Optical transmission system constructing method and system
HITACHI LTD48 citations96
US6825437B2Nov 30, 2004
Apparatus enabling particle detection utilizing wide view lens
HITACHI LTD22 citations93
US6576559B2Jun 10, 2003
Semiconductor manufacturing methods, plasma processing methods and plasma processing apparatuses
HITACHI LTD32 citations93
US6355570B1Mar 12, 2002
Semiconductor manufacturing methods, plasma processing methods and plasma processing apparatuses
HITACHI LTD22 citations93
US6195480B1Feb 27, 2001
Optical transmission device and optical transmission system employing the same
HITACHI LTD27 citations93
US5706125AJan 6, 1998
Optical signal amplifying circuit
HITACHI LTD21 citations93
US6266169B1Jul 24, 2001
Optical transmission equipment which transmits an amplified optical data signal and an optical surveillance signal
HITACHI LTD21 citations92
US6005699ADec 21, 1999
Optical wavelength multiplexing system
HITACHI LTD21 citations92
US5812289ASep 22, 1998
Optical repeater and optical transmitter
HITACHI LTD23 citations92
US8041213B2Oct 18, 2011
Optical transmission equipment and optical network
HITACHI LTD7 citations84
US7426023B2Sep 16, 2008
Method and apparatus for detecting defects
HITACHI LTD13 citations84
HITACHI HIGH TECH CORP
9 patentsUS7465935B2Dec 16, 2008
Method for inspecting pattern defect and device for realizing the same
HITACHI HIGH TECH CORP45 citations96
US7333192B2Feb 19, 2008
Apparatus and method for inspecting defects
HITACHI HIGH TECH CORP37 citations96
US7528942B2May 5, 2009
Method and apparatus for detecting defects
HITACHI HIGH TECH CORP32 citations93
US7369223B2May 6, 2008
Method of apparatus for detecting particles on a specimen
HITACHI HIGH TECH CORP25 citations92
US7859656B2Dec 28, 2010
Defect inspection method and system
HITACHI HIGH TECH CORP15 citations84
US7768635B2Aug 3, 2010
Apparatus and method for inspecting defects
HITACHI HIGH TECH CORP10 citations84
US7643139B2Jan 5, 2010
Method and apparatus for detecting defects
HITACHI HIGH TECH CORP8 citations84
US7492452B2Feb 17, 2009
Defect inspection method and system
HITACHI HIGH TECH CORP13 citations84
US7166480B2Jan 23, 2007
Particle control device and particle control method for vacuum processing apparatus
HITACHI HIGH TECH CORP10 citations84
ASMO CO LTD
4 patentsUS7603742B2Oct 20, 2009
Wiper blade and wiper system having the same
ASMO CO LTD54 citations97
US7636980B2Dec 29, 2009
Wiper blade having cover member
ASMO CO LTD53 citations94
US7526832B2May 5, 2009
Wiper blade having a lever connected to wiper arm
ASMO CO LTD54 citations93
US7748075B2Jul 6, 2010
Wiper system with wash and wipe mode
ASMO CO LTD10 citations84
SONY CORP
3 patentsHONDA MOTOR CO LTD
3 patentsMURATA MANUFACTURING CO
2 patentsUS6876280B2Apr 5, 2005
High-frequency switch, and electronic device using the same
MURATA MANUFACTURING CO129 citations98
US6153444ANov 28, 2000
Method of measuring free carrier concentration and/or thickness of a semiconductor and process of manufacturing semiconductor device and semiconductor wafer using such method
MURATA MANUFACTURING CO41 citations92
HITACHI COMM TECH LTD
2 patentsKAWASAKI STEEL CO
2 patentsNAKANO HIROYUKI
2 patentsSUMITOMO ELECTRIC INDUSTRIES
1 patentTOYOTA MOTOR CO LTD
1 patentHIDAKA HIROYOSHI
1 patentFUJITSU LTD
1 patentADVANCED DISPLAY KK
1 patentSHIBUYA KOGYO CO LTD
1 patentROHM & HAAS ELECT MAT
1 patentTOYODA MACHINE WORKS LTD
1 patentNIPPON LEAKLESS IND CO LTD
1 patentOMRON TATEISI ELECTRONICS CO
1 patentShowing the top 50 of 174 patents by PatentIndex Score.