Inventor
TABATABAEI SASSAN
US46 patents
⚠️ This page may combine multiple inventors who share the name “TABATABAEI SASSAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SITIME CORP
22 patentsUS10247621B1Apr 2, 2019
High resolution temperature sensor
SITIME CORP20 citations91
US11218984B1Jan 4, 2022
Fixed-beacon time transfer system
SITIME CORP6 citations86
US11005422B1May 11, 2021
Low allan-deviation oscillator
SITIME CORP3 citations84
US10622945B1Apr 14, 2020
Low Allan-Deviation oscillator
SITIME CORP4 citations84
US11228302B1Jan 18, 2022
Clock generator with dual-path temperature compensation
SITIME CORP3 citations82
US10979031B1Apr 13, 2021
Clock generator with dual-path temperature compensation
SITIME CORP4 citations82
US10594301B1Mar 17, 2020
Clock generator with dual-path temperature compensation
SITIME CORP9 citations82
US10622973B1Apr 14, 2020
Temperature sensor based on ratio of clock signals from respective MEMS resonators
SITIME CORP5 citations81
US11323071B1May 3, 2022
Low Allan-Deviation oscillator
SITIME CORP2 citations73
US11245361B1Feb 8, 2022
Temperature-reporting oscillator
SITIME CORP1 citations72
US10833632B1Nov 10, 2020
Temperature-reporting oscillator
SITIME CORP3 citations72
US11528014B1Dec 13, 2022
Clock generator with dual-path temperature compensation
SITIME CORP2 citations71
US11871369B1Jan 9, 2024
Time module apparatus for use with fixed-beacon time transfer system
SITIME CORP0 citations63
US12224709B1Feb 11, 2025
Cascaded oscillator designs
SITIME CORP0 citations62
US12166453B1Dec 10, 2024
Low Allan-deviation oscillator
SITIME CORP0 citations62
US12101062B1Sep 24, 2024
Temperature-reporting oscillator
SITIME CORP0 citations62
US11716055B1Aug 1, 2023
Low allan-deviation oscillator
SITIME CORP0 citations62
US11646698B1May 9, 2023
Temperature-reporting oscillator
SITIME CORP0 citations62
US11791802B1Oct 17, 2023
Clock generator with dual-path temperature compensation
SITIME CORP0 citations61
US11990908B1May 21, 2024
Dual-MEMS device with temperature correction of MEMS output based on relative MEMS operation
SITIME CORP0 citations59
US12294371B1May 6, 2025
Clock generator with dual-path temperature compensation
SITIME CORP0 citations58
US12047071B1Jul 23, 2024
Clock generator with dual-path temperature compensation
SITIME CORP0 citations58
GUIDE TECHNOLOGY INC
8 patentsUS7292947B1Nov 6, 2007
System and method of estimating phase noise based on measurement of phase jitter at multiple sampling frequencies
GUIDE TECHNOLOGY INC33 citations92
US7203610B2Apr 10, 2007
System and method of obtaining data-dependent jitter (DDJ) estimates from measured signal data
GUIDE TECHNOLOGY INC26 citations86
US7400988B2Jul 15, 2008
Periodic jitter (PJ) measurement methodology
GUIDE TECHNOLOGY INC11 citations84
US7164999B2Jan 16, 2007
Data-dependent jitter (DDJ) calibration methodology
GUIDE TECHNOLOGY INC10 citations80
US7239969B2Jul 3, 2007
System and method of generating test signals with injected data-dependent jitter (DDJ)
GUIDE TECHNOLOGY INC9 citations71
US7843771B2Nov 30, 2010
High resolution time interpolator
GUIDE TECHNOLOGY INC2 citations63
US7844022B2Nov 30, 2010
Jitter spectrum analysis using random sampling (RS)
GUIDE TECHNOLOGY INC3 citations63
US7623977B2Nov 24, 2009
Periodic jitter (PJ) measurement methodology
GUIDE TECHNOLOGY INC4 citations63
VIRAGE LOGIC CORP
6 patentsUS7653849B1Jan 26, 2010
Input-output device testing including embedded tests
VIRAGE LOGIC CORP59 citations98
US7598726B1Oct 6, 2009
Methods and apparatuses for test methodology of input-output circuits
VIRAGE LOGIC CORP26 citations96
US7590902B1Sep 15, 2009
Methods and apparatuses for external delay test of input-output circuits
VIRAGE LOGIC CORP25 citations96
US7779319B1Aug 17, 2010
Input-output device testing including delay tests
VIRAGE LOGIC CORP20 citations92
US7616036B1Nov 10, 2009
Programmable strobe and clock generator
VIRAGE LOGIC CORP11 citations92
US7519888B2Apr 14, 2009
Input-output device testing
VIRAGE LOGIC CORP10 citations84
SYNOPSYS INC
4 patentsUS8032806B1Oct 4, 2011
Input-output device testing including initializing and leakage testing input-output devices
SYNOPSYS INC9 citations92
US8032805B1Oct 4, 2011
Input-output device testing including voltage tests
SYNOPSYS INC3 citations74
US7856581B1Dec 21, 2010
Methods and apparatuses for external test methodology and initialization of input-output circuits
SYNOPSYS INC4 citations74
US7853847B1Dec 14, 2010
Methods and apparatuses for external voltage test of input-output circuits
SYNOPSYS INC1 citations63
TABATABAEI SASSAN
4 patentsUS8225156B1Jul 17, 2012
Methods and apparatuses for external voltage test methodology of input-output circuits
TABATABAEI SASSAN5 citations73
US7941287B2May 10, 2011
Periodic jitter (PJ) measurement methodology
TABATABAEI SASSAN6 citations73
US8255188B2Aug 28, 2012
Fast low frequency jitter rejection methodology
TABATABAEI SASSAN2 citations62
US8064293B2Nov 22, 2011
High resolution time interpolator
TABATABAEI SASSAN3 citations62