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Inventor
BENDI SHRIDHAR G
IN
2 patents
⚠️ This page may combine multiple inventors who share the name “BENDI SHRIDHAR G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
1 patent
US9515809B2
Dec 6, 2016
Testing using analog near end loop back circuit
INTEL CORP
2 citations
56
ADVANCED MICRO DEVICES INC
1 patent
US7568134B1
Jul 28, 2009
Method of exhaustively testing an embedded ROM using generated ATPG test patterns
ADVANCED MICRO DEVICES INC
1 citations
38