Inventor · disambiguated record
Hisao Kobashi
Also filed as: KOBASHI HISAO
7 granted patents·47 citations·filing 1997–2021
82Inventor score
Top patents by PatentIndex Score
7 records- 0177US9829532B2Semiconductor device and method of diagnosing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2016·Granted Nov 28, 2017·4 cites·20 claims
- 0265US6031782ASemiconductor memory device provided with an interface circuit consuming a reduced amount of current consumptionMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 29, 2000·25 cites·17 claims
- 0351US12061123B2Semiconductor device and trimming method of the sameRENESAS ELECTRONICS CORP·Filed 2021·Granted Aug 13, 2024·0 cites·8 claims
- 0447US6392939B1Semiconductor memory device with improved defect elimination rateMITSUBISHI ELECTRIC CORP·Filed 2000·Granted May 21, 2002·8 cites·9 claims
- 0543US10324123B2Semiconductor device and method of diagnosing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Jun 18, 2019·0 cites·14 claims
- 0641US6335886B1Semiconductor memory device including spare memory cellMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 1, 2002·5 cites·9 claims
- 0735US5761141ASemiconductor memory device and test method thereforMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jun 2, 1998·5 cites·4 claims
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