Inventor

OFIR YEHONATAN HAI

IL2 patents

Patents

2 patents

US12400319B2Aug 26, 2025

Defect examination on a semiconductor specimen

APPLIED MATERIALS ISRAEL LTD0 citations41

US12423800B2Sep 23, 2025

Machine learning based defect examination for semiconductor specimens

APPLIED MATERIALS ISRAEL LTD0 citations39