Inventor
BADANES RAN
IL3 patents
Patents
3 patentsUS11449711B2Sep 20, 2022
Machine learning-based defect detection of a specimen
APPLIED MATERIALS ISRAEL LTD2 citations66
US12400319B2Aug 26, 2025
Defect examination on a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations41
US12423800B2Sep 23, 2025
Machine learning based defect examination for semiconductor specimens
APPLIED MATERIALS ISRAEL LTD0 citations39