Inventor
KIMURA MIKIHIRO
JP15 patents
Patents
15 patentsUS5420513AMay 30, 1995
Dielectric breakdown prediction and dielectric breakdown life-time prediction using iterative voltage step stressing
MITSUBISHI ELECTRIC CORP44 citations95
US5841164ANov 24, 1998
Test structure for dielectric film evaluation
MITSUBISHI ELECTRIC CORP19 citations92
US5621222AApr 15, 1997
Superlattice semiconductor device
MITSUBISHI ELECTRIC CORP22 citations92
US5594349AJan 14, 1997
Dielecrtric breakdown prediction apparatus and method, and dielectric breakdown life-time prediction apparatus and method
MITSUBISHI ELECTRIC CORP34 citations92
US5247196ASep 21, 1993
Semiconductor memory device including capacitor having stacked structure and manufacturing method thereof
MITSUBISHI ELECTRIC CORP27 citations92
US5029321AJul 2, 1991
Solid state image sensing device formed of charge coupled devices
MITSUBISHI ELECTRIC CORP41 citations92
US4933731AJun 12, 1990
Superlattice imaging device
MITSUBISHI ELECTRIC CORP29 citations92
US5786689AJul 28, 1998
Apparatus including a measurement time counting device for measuring an electrical characteristic of semiconductor
MITSUBISHI ELECTRIC CORP18 citations83
US5114865AMay 19, 1992
Method of manufacturing a solid-state image sensing device having an overflow drain structure
MITSUBISHI ELECTRIC CORP19 citations81
US5086010AFeb 4, 1992
Method for manufacturing solid state image sensing device formed of charge coupled devices on side surfaces of trenches
MITSUBISHI ELECTRIC CORP18 citations81
US5051798ASep 24, 1991
Solid state image sensing device having an overflow drain structure
MITSUBISHI ELECTRIC CORP20 citations81
US5266892ANov 30, 1993
Method of measuring interface state density distribution in MIS structure
MITSUBISHI ELECTRIC CORP11 citations73
US5032786AJul 16, 1991
Method of a measuring physical properties of buried channel
MITSUBISHI ELECTRIC CORP15 citations73
US6040199AMar 21, 2000
Semiconductor test structure for estimating defects at isolation edge and test method using the same
MITSUBISHI ELECTRIC CORP4 citations62
US5874772AFeb 23, 1999
Semiconductor device
MITSUBISHI ELECTRIC CORP3 citations62