Inventor
KIRK MICHAEL
US25 patents
⚠️ This page may combine multiple inventors who share the name “KIRK MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AVX CORP
6 patentsUS10937575B2Mar 2, 2021
Cascade varistor having improved energy handling capabilities
AVX CORP8 citations83
US11295895B2Apr 5, 2022
Integrated capacitor filter and integrated capacitor filter with varistor function
AVX CORP2 citations73
US11735340B2Aug 22, 2023
Cascade varistor having improved energy handling capabilities
AVX CORP2 citations72
US10840018B2Nov 17, 2020
Multilayer electronic device having improved connectivity and method for making the same
AVX CORP6 citations72
US10529472B2Jan 7, 2020
Low aspect ratio varistor
AVX CORP2 citations72
US10607777B2Mar 31, 2020
Integrated capacitor filter and integrated capacitor filter with varistor function
AVX CORP1 citations62
HYDE ATHLETIC IND INC
4 patentsUS5860226AJan 19, 1999
Shoe construction
HYDE ATHLETIC IND INC45 citations94
US5729917AMar 24, 1998
Combination midsole stabilizer and enhancer
HYDE ATHLETIC IND INC42 citations94
US5561920AOct 8, 1996
Shoe construction having an energy return system
HYDE ATHLETIC IND INC91 citations94
US5402588AApr 4, 1995
Sole construction
HYDE ATHLETIC IND INC99 citations94
KLA TENCOR CORP
4 patentsUS10025894B2Jul 17, 2018
System and method to emulate finite element model based prediction of in-plane distortions due to semiconductor wafer chucking
KLA TENCOR CORP7 citations84
US9430593B2Aug 30, 2016
System and method to emulate finite element model based prediction of in-plane distortions due to semiconductor wafer chucking
KLA TENCOR CORP10 citations84
US10234402B2Mar 19, 2019
Systems and methods for defect material classification
KLA TENCOR CORP5 citations70
US10670537B2Jun 2, 2020
Systems and methods for defect material classification
KLA TENCOR CORP0 citations49
THERMOMICROSCOPES CORP
3 patentsUS5939719AAug 17, 1999
Scanning probe microscope with scan correction
THERMOMICROSCOPES CORP44 citations96
US6310342B1Oct 30, 2001
Optical microscope stage for scanning probe microscope
THERMOMICROSCOPES CORP68 citations94
US6057546AMay 2, 2000
Kinematically mounted probe holder for scanning probe microscope
THERMOMICROSCOPES CORP45 citations92