Inventor

DE JONG ALAN FRANK

NL8 patents

⚠️ This page may combine multiple inventors who share the name “DE JONG ALAN FRANK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FEI CO

2 patents

US7915584B2Mar 29, 2011

TEM with aberration corrector and phase plate

FEI CO19 citations82

US9958403B1May 1, 2018

Arrangement for X-Ray tomography

FEI CO0 citations38

BOUGHORBEL FAYSAL

1 patent

US8581189B2Nov 12, 2013

Charged particle microscopy imaging method

BOUGHORBEL FAYSAL18 citations90

TOTH MILOS

1 patent

US8598542B2Dec 3, 2013

Charged particle beam processing

TOTH MILOS5 citations71

LUECKEN UWE

1 patent

US8592762B2Nov 26, 2013

Method of using a direct electron detector for a TEM

LUECKEN UWE5 citations70

TIEMEIJER PETER CHRISTIAAN

1 patent

US8692196B2Apr 8, 2014

Method of use for a multipole detector for a transmission electron microscope

TIEMEIJER PETER CHRISTIAAN4 citations69

FABER JACOB SIMON

1 patent

US8597565B2Dec 3, 2013

Method for forming microscopic 3D structures

FABER JACOB SIMON2 citations54

VAN VEEN GERARD ANNE NICOLAAS

1 patent

US9162211B2Oct 20, 2015

Micro-reactor for observing particles in a fluid

VAN VEEN GERARD ANNE NICOLAAS3 citations50