P

Inventor

HOUSLEY RICHARD T

US14 patents
⚠️ This page may combine multiple inventors who share the name “HOUSLEY RICHARD T”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

11 patents
US11009798B2May 18, 2021

Wafer alignment markers, systems, and related methods

MICRON TECHNOLOGY INC5 citations82
US8796086B2Aug 5, 2014

Methods of forming an array of memory cells, methods of forming a plurality of field effect transistors, methods of forming source/drain regions and isolation trenches, and methods of forming a series of spaced trenches into a substrate

MICRON TECHNOLOGY INC4 citations82
US10461038B1Oct 29, 2019

Methods of alignment marking semiconductor wafers, and semiconductor packages having portions of alignment markings

MICRON TECHNOLOGY INC2 citations72
US12230546B2Feb 18, 2025

Wafer registration and overlay measurement systems and related methods

MICRON TECHNOLOGY INC0 citations61
US11520240B2Dec 6, 2022

Wafer alignment markers, systems, and related methods

MICRON TECHNOLOGY INC0 citations61
US11251096B2Feb 15, 2022

Wafer registration and overlay measurement systems and related methods

MICRON TECHNOLOGY INC0 citations61
US10756022B2Aug 25, 2020

Methods of alignment marking semiconductor wafers, and semiconductor packages having portions of alignment markings

MICRON TECHNOLOGY INC0 citations51
US11075169B2Jul 27, 2021

Integrated-circuitry overlay alignment mark, a substrate comprising an overlay alignment mark, a method of forming an overlay alignment mark in the fabrication of integrated circuitry, and a method of determining overlay alignment in the fabrication of integrated circuitry

MICRON TECHNOLOGY INC0 citations50
US9343114B2May 17, 2016

Memory arrays and methods of forming electrical contacts

MICRON TECHNOLOGY INC0 citations50
US8796786B2Aug 5, 2014

Memory arrays and methods of forming electrical contacts

MICRON TECHNOLOGY INC0 citations50
US11784077B2Oct 10, 2023

Wafer overlay marks, overlay measurement systems, and related methods

MICRON TECHNOLOGY INC0 citations49

DAVIS NEAL L

2 patents

HOUSLEY RICHARD T

1 patent