Inventor
FANG SHANG-WEI
TW15 patents
⚠️ This page may combine multiple inventors who share the name “FANG SHANG-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
12 patentsUS11152348B2Oct 19, 2021
Integrated circuit with mixed row heights
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations72
US10510623B2Dec 17, 2019
Overlay error and process window metrology
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations70
US12588278B2Mar 24, 2026
Semiconductor device having different size active regions and method of making
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12324228B2Jun 3, 2025
Methods of resistance and capacitance reduction to circuit output nodes
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12132049B2Oct 29, 2024
Integrated circuit device with high mobility and system of forming the integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11658182B2May 23, 2023
Integrated circuit device with high mobility and system of forming the integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11309311B2Apr 19, 2022
Methods of resistance and capacitance reduction to circuit output nodes
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10971493B2Apr 6, 2021
Integrated circuit device with high mobility and system of forming the integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12462086B2Nov 4, 2025
Integrated circuit having hybrid sheet structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US11916070B2Feb 27, 2024
Semiconductor structure with nanosheets
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US11893333B2Feb 6, 2024
Hybrid sheet layout, method, system, and structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10879135B2Dec 29, 2020
Overlay error and process window metrology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49