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Inventor
KUDELKA STEPHAN P
US
2 patents
Patents
2 patents
US6284666B1
Sep 4, 2001
Method of reducing RIE lag for deep trench silicon etching
IBM
87 citations
95
US6518616B2
Feb 11, 2003
Vertical gate top engineering for improved GC and CB process windows
IBM
22 citations
88