Inventor

HSU CHIN-JUNG

US3 patents

⚠️ This page may combine multiple inventors who share the name “HSU CHIN-JUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INSPEX INC

2 patents

US6028664AFeb 22, 2000

Method and system for establishing a common reference point on a semiconductor wafer inspected by two or more scanning mechanisms

INSPEX INC46 citations87

US6643006B1Nov 4, 2003

Method and system for reviewing a semiconductor wafer using at least one defect sampling condition

INSPEX INC18 citations80

(unassigned)

1 patent

US6842866B2Jan 11, 2005

Method and system for analyzing bitmap test data

31 citations85