Inventor

OBERMUELLER THOMAS

AT3 patents

Patents

3 patents

US10673545B1Jun 2, 2020

Noise measurement for integrated circuit device with on-device test signal up-conversion

INFINEON TECHNOLOGIES AG5 citations63

US12442893B2Oct 14, 2025

On-chip reflection coefficient measurement system

INFINEON TECHNOLOGIES AG0 citations45

US12294638B2May 6, 2025

Method for monitoring a radio frequency receiver and semiconductor device

INFINEON TECHNOLOGIES AG0 citations38