Inventor
LUONG DIEN
US6 patents
Patents
6 patentsUS6365421B2Apr 2, 2002
Method and apparatus for storage of test results within an integrated circuit
MICRON TECHNOLOGY INC118 citations98
US6194738B1Feb 27, 2001
Method and apparatus for storage of test results within an integrated circuit
MICRON TECHNOLOGY INC102 citations97
US6185705B1Feb 6, 2001
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC28 citations92
US6983404B2Jan 3, 2006
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC7 citations73
US6154410ANov 28, 2000
Method and apparatus for reducing antifuse programming time
MICRON TECHNOLOGY INC11 citations73
US5982656ANov 9, 1999
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC10 citations73