Inventor
SHIN KAE YOUNG
KR3 patents
Patents
3 patentsUS9652836B2May 16, 2017
Defect cell clustering method and apparatus thereof
SAMSUNG SDS CO LTD0 citations32
US9547544B2Jan 17, 2017
Method for verifying bad pattern in time series sensing data and apparatus thereof
SAMSUNG SDS CO LTD0 citations29
US9665795B2May 30, 2017
Method and apparatus for identifying root cause of defect using composite defect map
SAMSUNG SDS CO LTD0 citations24