Inventor
AHN DAE JUNG
KR3 patents
Patents
3 patentsUS10050772B2Aug 14, 2018
Method and apparatus for generating standard pattern for data signals
SAMSUNG SDS CO LTD0 citations41
US9652836B2May 16, 2017
Defect cell clustering method and apparatus thereof
SAMSUNG SDS CO LTD0 citations32
US9547544B2Jan 17, 2017
Method for verifying bad pattern in time series sensing data and apparatus thereof
SAMSUNG SDS CO LTD0 citations29