Inventor

CHAKRABORTY TAPAN J

US8 patents

⚠️ This page may combine multiple inventors who share the name “CHAKRABORTY TAPAN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ALCATEL LUCENT USA INC

3 patents

US7962885B2Jun 14, 2011

Method and apparatus for describing components adapted for dynamically modifying a scan path for system-on-chip testing

ALCATEL LUCENT USA INC12 citations82

US7949915B2May 24, 2011

Method and apparatus for describing parallel access to a system-on-chip

ALCATEL LUCENT USA INC11 citations82

US7958479B2Jun 7, 2011

Method and apparatus for describing and testing a system-on-chip

ALCATEL LUCENT USA INC4 citations61

LUCENT TECHNOLOGIES INC

2 patents

US5606567AFeb 25, 1997

Delay testing of high-performance digital components by a slow-speed tester

LUCENT TECHNOLOGIES INC61 citations94

US7284159B2Oct 16, 2007

Fault injection method and system

LUCENT TECHNOLOGIES INC27 citations90

AT & T CORP

1 patent

US5499249AMar 12, 1996

Method and apparatus for test generation and fault simulation for sequential circuits with embedded random access memories (RAMs)

AT & T CORP34 citations91

AT & T BELL LAB

1 patent

US5365528ANov 15, 1994

Method for testing delay faults in non-scan sequential circuits

AT & T BELL LAB15 citations72

QUALCOMM INC

1 patent

US9285418B2Mar 15, 2016

Method and apparatus for characterizing thermal marginality in an integrated circuit

QUALCOMM INC0 citations48