Inventor
DEHAVEN PATRICK W
US21 patents
⚠️ This page may combine multiple inventors who share the name “DEHAVEN PATRICK W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
18 patentsUS6123825ASep 26, 2000
Electromigration-resistant copper microstructure and process of making
IBM85 citations96
US7105360B2Sep 12, 2006
Low temperature melt-processing of organic-inorganic hybrid
IBM15 citations92
US6572982B1Jun 3, 2003
Electromigration-resistant copper microstructure
IBM15 citations92
US5943601AAug 24, 1999
Process for fabricating a metallization structure
IBM27 citations92
US5171642ADec 15, 1992
Multilayered intermetallic connection for semiconductor devices
IBM33 citations92
US6126761AOct 3, 2000
Process of controlling grain growth in metal films
IBM29 citations89
US7407875B2Aug 5, 2008
Low resistance contact structure and fabrication thereof
IBM16 citations84
US9224675B1Dec 29, 2015
Automatic capacitance tuning for robust middle of the line contact and silicide applications
IBM18 citations83
US6916729B2Jul 12, 2005
Salicide formation method
IBM16 citations83
US7951708B2May 31, 2011
Copper interconnect structure with amorphous tantalum iridium diffusion barrier
IBM5 citations63
US6509265B1Jan 21, 2003
Process for manufacturing a contact barrier
IBM4 citations62
US6909772B2Jun 21, 2005
Method and apparatus for thin film thickness mapping
IBM3 citations61
US6638374B2Oct 28, 2003
Device produced by a process of controlling grain growth in metal films
IBM2 citations61
US6361627B1Mar 26, 2002
Process of controlling grain growth in metal films
IBM2 citations61
US7456045B2Nov 25, 2008
Low temperature melt-processing of organic-inorganic hybrid
IBM0 citations52
US7291516B2Nov 6, 2007
Low temperature melt-processing of organic-inorganic hybrid
IBM0 citations52
US6180521B1Jan 30, 2001
Process for manufacturing a contact barrier
IBM0 citations51
US7223691B2May 29, 2007
Method of forming low resistance and reliable via in inter-level dielectric interconnect
IBM0 citations48