Inventor
OKAZAWA TAKESHI
JP27 patents
⚠️ This page may combine multiple inventors who share the name “OKAZAWA TAKESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
19 patentsUS4716131ADec 29, 1987
Method of manufacturing semiconductor device having polycrystalline silicon layer with metal silicide film
NEC CORP238 citations98
US6643168B2Nov 4, 2003
Nonvolatile magnetic storage device
NEC CORP55 citations96
US6532163B2Mar 11, 2003
Non-volatile semiconductor memory device with magnetic memory cell array
NEC CORP55 citations96
US5787036AJul 28, 1998
Flash memory including improved transistor cells and a method of programming the memory
NEC CORP82 citations96
US5295107AMar 15, 1994
Method of erasing data stored in flash type nonvolatile memory cell
NEC CORP64 citations95
US6477077B2Nov 5, 2002
Non-volatile memory device
NEC CORP55 citations92
US5973355AOct 26, 1999
Nonvolatile semiconductor memory device and manufacturing method of the same
NEC CORP29 citations92
US5316961AMay 31, 1994
Floating gate type erasable and programmable read only memory cell, method of making the same, and electrically erasing and writing method
NEC CORP28 citations92
US5309402AMay 3, 1994
Flash electrically erasable and programmable ROM
NEC CORP21 citations92
US5208179AMay 4, 1993
Method of fabricating programmable read only memory device having trench isolation structure
NEC CORP30 citations92
US4980732ADec 25, 1990
Semiconductor device having an improved thin film transistor
NEC CORP44 citations92
US4700212AOct 13, 1987
Semiconductor integrated circuit device of high degree of integration
NEC CORP35 citations92
US4584760AApr 29, 1986
Method of manufacturing a semiconductor device having a polycrystalline silicon layer
NEC CORP25 citations82
US5523976AJun 4, 1996
Non-volatile semiconductor memory device having a memory cell group operative as a redundant memory cell group for replacement of another group
NEC CORP7 citations74
US5523969AJun 4, 1996
Electrically erasable programmable non-volatile semiconductor memory device and method for manufacturing the same
NEC CORP7 citations74
US5371704ADec 6, 1994
Nonvolatile memory device with compensation for over-erasing operation
NEC CORP15 citations74
US5972750AOct 26, 1999
Nonvolatile semiconductor memory device and manufacturing method of the same
NEC CORP9 citations73
US5675163AOct 7, 1997
Non-volatile semiconductor memory device with thin insulation layer below erase gate
NEC CORP6 citations63
US4885624ADec 5, 1989
Stacked metal-insulator semiconductor device
NEC CORP0 citations42
NEC ELECTRONICS CORP
8 patentsUS6703249B2Mar 9, 2004
Method of fabricating magnetic random access memory operating based on tunnel magnetroresistance effect
NEC ELECTRONICS CORP57 citations96
US7405958B2Jul 29, 2008
Magnetic memory device having XP cell and Str cell in one chip
NEC ELECTRONICS CORP22 citations92
US6812537B2Nov 2, 2004
Magnetic memory and method of operation thereof
NEC ELECTRONICS CORP32 citations92
US6939722B2Sep 6, 2005
Method of forming magnetic memory
NEC ELECTRONICS CORP16 citations84
US6746875B2Jun 8, 2004
Magnetic memory and method of its manufacture
NEC ELECTRONICS CORP8 citations74
US7009876B2Mar 7, 2006
MRAM and data writing method therefor
NEC ELECTRONICS CORP4 citations63
US6674663B2Jan 6, 2004
Nonvolatile storage device and operating method thereof
NEC ELECTRONICS CORP5 citations62
US6834018B2Dec 21, 2004
Nonvolatile memory device having data read operation with using reference cell and method thereof
NEC ELECTRONICS CORP2 citations54