Inventor
KAMANA RAJESH
US6 patents
Patents
6 patentsUS10672500B2Jun 2, 2020
Non-contact measurement of memory cell threshold voltage
MICRON TECHNOLOGY INC2 citations71
US10650891B2May 12, 2020
Non-contact electron beam probing techniques and related structures
MICRON TECHNOLOGY INC3 citations71
US10403359B2Sep 3, 2019
Non-contact electron beam probing techniques and related structures
MICRON TECHNOLOGY INC2 citations71
US11636911B2Apr 25, 2023
Leakage source detection for memory with varying conductive path lengths
MICRON TECHNOLOGY INC0 citations58
US11081203B2Aug 3, 2021
Leakage source detection by scanning access lines
MICRON TECHNOLOGY INC0 citations58
US10381101B2Aug 13, 2019
Non-contact measurement of memory cell threshold voltage
MICRON TECHNOLOGY INC0 citations50