Inventor
BAJAJ RAJEEV
US112 patents
⚠️ This page may combine multiple inventors who share the name “BAJAJ RAJEEV”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
29 patentsUS6537144B1Mar 25, 2003
Method and apparatus for enhanced CMP using metals having reductive properties
APPLIED MATERIALS INC145 citations99
US6602724B2Aug 5, 2003
Chemical mechanical polishing of a metal layer with polishing rate monitoring
APPLIED MATERIALS INC95 citations98
US6569349B1May 27, 2003
Additives to CMP slurry to polish dielectric films
APPLIED MATERIALS INC92 citations98
US9873180B2Jan 23, 2018
CMP pad construction with composite material properties using additive manufacturing processes
APPLIED MATERIALS INC41 citations97
US9744724B2Aug 29, 2017
Apparatus for printing a chemical mechanical polishing pad
APPLIED MATERIALS INC42 citations97
US9457520B2Oct 4, 2016
Apparatus for printing a chemical mechanical polishing pad
APPLIED MATERIALS INC48 citations97
US6561873B2May 13, 2003
Method and apparatus for enhanced CMP using metals having reductive properties
APPLIED MATERIALS INC66 citations96
US10953515B2Mar 23, 2021
Apparatus and method of forming a polishing pads by use of an additive manufacturing process
APPLIED MATERIALS INC16 citations94
US10875153B2Dec 29, 2020
Advanced polishing pad materials and formulations
APPLIED MATERIALS INC16 citations94
US10618141B2Apr 14, 2020
Apparatus for forming a polishing article that has a desired zeta potential
APPLIED MATERIALS INC18 citations94
US10537974B2Jan 21, 2020
CMP pad construction with composite material properties using additive manufacturing processes
APPLIED MATERIALS INC17 citations94
US10493691B2Dec 3, 2019
Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
APPLIED MATERIALS INC16 citations94
US10456886B2Oct 29, 2019
Porous chemical mechanical polishing pads
APPLIED MATERIALS INC26 citations94
US10399201B2Sep 3, 2019
Advanced polishing pads having compositional gradients by use of an additive manufacturing process
APPLIED MATERIALS INC24 citations94
US10391605B2Aug 27, 2019
Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
APPLIED MATERIALS INC19 citations94
US10029405B2Jul 24, 2018
Printing a chemical mechanical polishing pad
APPLIED MATERIALS INC24 citations94
US9776361B2Oct 3, 2017
Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
APPLIED MATERIALS INC21 citations94
US10593574B2Mar 17, 2020
Techniques for combining CMP process tracking data with 3D printed CMP consumables
APPLIED MATERIALS INC19 citations93
US10384330B2Aug 20, 2019
Polishing pads produced by an additive manufacturing process
APPLIED MATERIALS INC22 citations93
US6783432B2Aug 31, 2004
Additives for pressure sensitive polishing compositions
APPLIED MATERIALS INC19 citations93
US6520840B1Feb 18, 2003
CMP slurry for planarizing metals
APPLIED MATERIALS INC25 citations93
US6435944B1Aug 20, 2002
CMP slurry for planarizing metals
APPLIED MATERIALS INC23 citations93
US6790768B2Sep 14, 2004
Methods and apparatus for polishing substrates comprising conductive and dielectric materials with reduced topographical defects
APPLIED MATERIALS INC13 citations92
US6638143B2Oct 28, 2003
Ion exchange materials for chemical mechanical polishing
APPLIED MATERIALS INC41 citations92
US6632124B2Oct 14, 2003
Optical monitoring in a two-step chemical mechanical polishing process
APPLIED MATERIALS INC17 citations92
US6506097B1Jan 14, 2003
Optical monitoring in a two-step chemical mechanical polishing process
APPLIED MATERIALS INC36 citations92
US6261157B1Jul 17, 2001
Selective damascene chemical mechanical polishing
APPLIED MATERIALS INC52 citations92
US6436302B1Aug 20, 2002
Post CU CMP polishing for reduced defects
APPLIED MATERIALS INC45 citations90
US10919123B2Feb 16, 2021
Piezo-electric end-pointing for 3D printed CMP pads
APPLIED MATERIALS INC17 citations85
MOTOROLA INC
9 patentsUS6001730ADec 14, 1999
Chemical mechanical polishing (CMP) slurry for polishing copper interconnects which use tantalum-based barrier layers
MOTOROLA INC324 citations98
US5916011AJun 29, 1999
Process for polishing a semiconductor device substrate
MOTOROLA INC66 citations96
US5897375AApr 27, 1999
Chemical mechanical polishing (CMP) slurry for copper and method of use in integrated circuit manufacture
MOTOROLA INC338 citations95
US5899745AMay 4, 1999
Method of chemical mechanical polishing (CMP) using an underpad with different compression regions and polishing pad therefor
MOTOROLA INC68 citations94
US6204169B1Mar 20, 2001
Processing for polishing dissimilar conductive layers in a semiconductor device
MOTOROLA INC42 citations91
US6071816AJun 6, 2000
Method of chemical mechanical planarization using a water rinse to prevent particle contamination
MOTOROLA INC35 citations91
US5882243AMar 16, 1999
Method for polishing a semiconductor wafer using dynamic control
MOTOROLA INC34 citations90
US6045435AApr 4, 2000
Low selectivity chemical mechanical polishing (CMP) process for use on integrated circuit metal interconnects
MOTOROLA INC44 citations89
US6001726ADec 14, 1999
Method for using a conductive tungsten nitride etch stop layer to form conductive interconnects and tungsten nitride contact structure
MOTOROLA INC46 citations87
BAJAJ RAJEEV
6 patentsUS9067299B2Jun 30, 2015
Printed chemical mechanical polishing pad
BAJAJ RAJEEV60 citations97
US8066555B2Nov 29, 2011
Polishing pad
BAJAJ RAJEEV43 citations94
US9296085B2Mar 29, 2016
Polishing pad with homogeneous body having discrete protrusions thereon
BAJAJ RAJEEV32 citations93
US8292692B2Oct 23, 2012
Polishing pad with endpoint window and systems and method using the same
BAJAJ RAJEEV38 citations92
US8177603B2May 15, 2012
Polishing pad composition
BAJAJ RAJEEV37 citations92
US8075745B2Dec 13, 2011
Electro-method and apparatus for improved chemical mechanical planarization pad with uniform polish performance
BAJAJ RAJEEV41 citations92
SEMIQUEST INC
3 patentsUS7846008B2Dec 7, 2010
Method and apparatus for improved chemical mechanical planarization and CMP pad
SEMIQUEST INC52 citations97
US7530880B2May 12, 2009
Method and apparatus for improved chemical mechanical planarization pad with pressure control and process monitor
SEMIQUEST INC54 citations95
US7815778B2Oct 19, 2010
Electro-chemical mechanical planarization pad with uniform polish performance
SEMIQUEST INC44 citations92
LAM RES CORP
2 patents(unassigned)
1 patentShowing the top 50 of 112 patents by PatentIndex Score.