Inventor
KETCHEN MARK B
US49 patents
⚠️ This page may combine multiple inventors who share the name “KETCHEN MARK B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
35 patentsUS9564573B1Feb 7, 2017
Trilayer josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits
IBM40 citations97
US7733109B2Jun 8, 2010
Test structure for resistive open detection using voltage contrast inspection and related methods
IBM92 citations97
US5055158AOct 8, 1991
Planarization of Josephson integrated circuit
IBM78 citations95
US10381542B2Aug 13, 2019
Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits
IBM16 citations94
US4588947AMay 13, 1986
Integrated miniature DC SQUID susceptometer for measuring properties of very small samples
IBM42 citations93
US9614532B1Apr 4, 2017
Single-flux-quantum probabilistic digitizer
IBM18 citations92
US7190233B2Mar 13, 2007
Methods and apparatus for measuring change in performance of ring oscillator circuit
IBM35 citations92
US7069525B2Jun 27, 2006
Method and apparatus for determining characteristics of MOS devices
IBM22 citations92
US6960926B2Nov 1, 2005
Method and apparatus for characterizing a circuit with multiple inputs
IBM29 citations92
US6798261B1Sep 28, 2004
Method and apparatus for characterizing switching history impact
IBM31 citations92
US6545333B1Apr 8, 2003
Light controlled silicon on insulator device
IBM23 citations92
US5056111AOct 8, 1991
Integrated terahertz electromagnetic wave system
IBM44 citations92
US4851767AJul 25, 1989
Detachable high-speed opto-electronic sampling probe
IBM37 citations92
US6605981B2Aug 12, 2003
Apparatus for biasing ultra-low voltage logic circuits
IBM51 citations91
US5523686AJun 4, 1996
Probes for scanning SQUID magnetometers
IBM19 citations90
US5635836AJun 3, 1997
Mechanical apparatus with rod, pivot, and translation means for positioning a sample for use with a scanning microscope
IBM26 citations87
US10199554B2Feb 5, 2019
Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits
IBM8 citations84
US7504875B2Mar 17, 2009
Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit
IBM10 citations84
US7355902B2Apr 8, 2008
Methods and apparatus for inline characterization of high speed operating margins of a storage element
IBM9 citations84
US7295057B2Nov 13, 2007
Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit
IBM11 citations84
US7265639B2Sep 4, 2007
Methods and apparatus for ring oscillator based MOSFET gate capacitance measurements
IBM14 citations84
US7085658B2Aug 1, 2006
Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips
IBM14 citations84
US9793913B2Oct 17, 2017
Single-flux-quantum probabilistic digitizer
IBM5 citations83
US7504896B2Mar 17, 2009
Methods and apparatus for inline measurement of switching delay history effects in PD-SOI technology
IBM7 citations74
US7176695B2Feb 13, 2007
Method and apparatus for measuring transfer characteristics of a semiconductor device
IBM6 citations74
US4528530AJul 9, 1985
Low temperature electronic package having a superconductive interposer for interconnecting strip type circuits
IBM15 citations74
US8755220B2Jun 17, 2014
Hybrid superconducting-magnetic memory cell and array
IBM2 citations63
US8691608B2Apr 8, 2014
Semiconductor devices having nanochannels confined by nanometer-spaced electrodes
IBM2 citations63
US7512509B2Mar 31, 2009
M1 testable addressable array for device parameter characterization
IBM3 citations63
US11133452B2Sep 28, 2021
Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits
IBM0 citations62
US7342406B2Mar 11, 2008
Methods and apparatus for inline variability measurement of integrated circuit components
IBM2 citations61
US7583125B2Sep 1, 2009
Methods and apparatus for pulse generation used in characterizing electronic fuses
IBM0 citations52
US7145347B2Dec 5, 2006
Method and apparatus for measuring transfer characteristics of a semiconductor device
IBM0 citations52
US7595654B2Sep 29, 2009
Methods and apparatus for inline variability measurement of integrated circuit components
IBM0 citations51
US8027797B2Sep 27, 2011
Methods and apparatus for determining a switching history time constant in an integrated circuit device
IBM0 citations41
BHUSHAN MANJUL
6 patentsUS8456169B2Jun 4, 2013
High speed measurement of random variation/yield in integrated circuit device testing
BHUSHAN MANJUL3 citations62
US8310269B2Nov 13, 2012
Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions
BHUSHAN MANJUL2 citations62
US8248094B2Aug 21, 2012
Acquisition of silicon-on-insulator switching history effects statistics
BHUSHAN MANJUL4 citations62
US8179120B2May 15, 2012
Single level of metal test structure for differential timing and variability measurements of integrated circuits
BHUSHAN MANJUL3 citations60
US9194909B2Nov 24, 2015
Single level of metal test structure for differential timing and variability measurements of integrated circuits
BHUSHAN MANJUL0 citations50
US9075109B2Jul 7, 2015
Single level of metal test structure for differential timing and variability measurements of integrated circuits
BHUSHAN MANJUL0 citations50