Inventor
KOBAYASHI KINYA
JP24 patents
⚠️ This page may combine multiple inventors who share the name “KOBAYASHI KINYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
11 patentsUS7473892B2Jan 6, 2009
Mass spectrometer system
HITACHI HIGH TECH CORP72 citations98
US6917037B2Jul 12, 2005
Mass spectrum analyzing system
HITACHI HIGH TECH CORP22 citations92
US7932486B2Apr 26, 2011
Mass spectrometer system
HITACHI HIGH TECH CORP7 citations84
US7595484B2Sep 29, 2009
Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program
HITACHI HIGH TECH CORP16 citations84
US7538321B2May 26, 2009
Method of identifying substances using mass spectrometry
HITACHI HIGH TECH CORP9 citations83
US6914239B2Jul 5, 2005
System for analyzing mass spectrometric data
HITACHI HIGH TECH CORP13 citations83
US7544930B2Jun 9, 2009
Tandem type mass analysis system and method
HITACHI HIGH TECH CORP2 citations63
US7126113B2Oct 24, 2006
Mass spectrometry system
HITACHI HIGH TECH CORP2 citations63
US6957159B2Oct 18, 2005
System for analyzing compound structure
HITACHI HIGH TECH CORP6 citations62
US7485852B2Feb 3, 2009
Mass analysis method and mass analysis apparatus
HITACHI HIGH TECH CORP6 citations58
US7435949B2Oct 14, 2008
Mass spectrometric analysis method and system using the method
HITACHI HIGH TECH CORP1 citations52
HITACHI LTD
9 patentsUS6745134B2Jun 1, 2004
Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system
HITACHI LTD29 citations92
US7180056B2Feb 20, 2007
Mass spectrometry and mass spectrometry system
HITACHI LTD11 citations84
US6511588B1Jan 28, 2003
Plating method using an additive
HITACHI LTD19 citations83
US7158893B2Jan 2, 2007
Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system
HITACHI LTD6 citations73
US6907352B2Jun 14, 2005
Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system
HITACHI LTD10 citations73
US6926816B2Aug 9, 2005
Analysis method of film thickness distribution and design system of printed circuit board and manufacturing processes
HITACHI LTD5 citations63
US6806098B2Oct 19, 2004
Method and device for assessing surface uniformity of semiconductor device treated by CMP
HITACHI LTD5 citations62
US10318679B2Jun 11, 2019
Calculation method of switching waveform of the inverter and circuit simulation model
HITACHI LTD0 citations52
US7332713B2Feb 19, 2008
Mass spectrometric method and mass spectrometric system
HITACHI LTD0 citations52