Inventor
NAYA MASAYUKI
JP85 patents
⚠️ This page may combine multiple inventors who share the name “NAYA MASAYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJI PHOTO FILM CO LTD
28 patentsUS6864984B2Mar 8, 2005
Measuring method and apparatus using attenuation in total reflection
FUJI PHOTO FILM CO LTD60 citations96
US5917607AJun 29, 1999
Surface plasmon sensor for multiple channel analysis
FUJI PHOTO FILM CO LTD79 citations96
US6611367B1Aug 26, 2003
Surface plasmon optical modulator element
FUJI PHOTO FILM CO LTD27 citations93
US6597456B2Jul 22, 2003
Measuring chip for quantitative analysis of substances
FUJI PHOTO FILM CO LTD22 citations93
US6577396B1Jun 10, 2003
Surface plasmon sensor
FUJI PHOTO FILM CO LTD20 citations93
US6497996B1Dec 24, 2002
Fine pattern forming method
FUJI PHOTO FILM CO LTD24 citations93
US6437887B1Aug 20, 2002
Optical logic device and optical memory device
FUJI PHOTO FILM CO LTD27 citations93
US6417925B1Jul 9, 2002
Surface plasmon sensor for analyzing liquid sample or humid atmosphere
FUJI PHOTO FILM CO LTD52 citations93
US6344367B1Feb 5, 2002
Method of fabricating a diffraction grating
FUJI PHOTO FILM CO LTD34 citations93
US5926284AJul 20, 1999
Surface plasmon sensor
FUJI PHOTO FILM CO LTD49 citations93
US5923031AJul 13, 1999
Surface plasmon sensor having a coupler with a refractive index matching liquid
FUJI PHOTO FILM CO LTD44 citations93
US5917608AJun 29, 1999
Surface plasmon sensor
FUJI PHOTO FILM CO LTD26 citations93
US5907408AMay 25, 1999
Surface plasmon sensor
FUJI PHOTO FILM CO LTD23 citations93
US5875032AFeb 23, 1999
Surface plasmon sensor having an improved optical system
FUJI PHOTO FILM CO LTD22 citations93
US5856873AJan 5, 1999
Ellipso sensor using a prism
FUJI PHOTO FILM CO LTD35 citations93
US7064837B2Jun 20, 2006
Measuring sensor utilizing attenuated total reflection and measuring chip assembly
FUJI PHOTO FILM CO LTD20 citations92
US7187444B2Mar 6, 2007
Measuring method and apparatus using attenuation in total internal reflection
FUJI PHOTO FILM CO LTD14 citations84
US6992770B2Jan 31, 2006
Sensor utilizing attenuated total reflection
FUJI PHOTO FILM CO LTD12 citations84
US6885454B2Apr 26, 2005
Measuring apparatus
FUJI PHOTO FILM CO LTD14 citations84
US6340448B1Jan 22, 2002
Surface plasmon sensor
FUJI PHOTO FILM CO LTD18 citations84
US6208422B1Mar 27, 2001
Surface plasmon sensor
FUJI PHOTO FILM CO LTD15 citations84
US6338924B1Jan 15, 2002
Photomask for near-field exposure having opening filled with transparent material
FUJI PHOTO FILM CO LTD16 citations83
US7057731B2Jun 6, 2006
Measuring method and apparatus using attenuated total reflection
FUJI PHOTO FILM CO LTD8 citations74
US6998223B1Feb 14, 2006
Optical wavelength converting device and process for producing the same
FUJI PHOTO FILM CO LTD9 citations74
US6947145B2Sep 20, 2005
Measuring apparatus
FUJI PHOTO FILM CO LTD11 citations74
US6232588B1May 15, 2001
Near field scanning apparatus having an intensity distribution pattern detection
FUJI PHOTO FILM CO LTD9 citations74
US5265110ANov 23, 1993
Non-linear optical effect frequency conversion laser
FUJI PHOTO FILM CO LTD10 citations74
US5231643AJul 27, 1993
Optical frequency converter of bulk resonator structure
FUJI PHOTO FILM CO LTD11 citations74
FUJIFILM CORP
19 patentsUS7288419B2Oct 30, 2007
Microstructure for use in Raman spectrometry and production process for the microstructure
FUJIFILM CORP39 citations93
US10704255B2Jul 7, 2020
Soundproof structure and soundproof structure manufacturing method
FUJIFILM CORP14 citations86
US10854183B2Dec 1, 2020
Soundproof structure
FUJIFILM CORP7 citations84
US10099317B2Oct 16, 2018
Soundproof structure and soundproof structure manufacturing method
FUJIFILM CORP12 citations84
US7999934B2Aug 16, 2011
Spectroscopic device and raman spectroscopic system
FUJIFILM CORP7 citations84
US7643156B2Jan 5, 2010
Sensor, multichannel sensor, sensing apparatus, and sensing method
FUJIFILM CORP9 citations84
US7501649B2Mar 10, 2009
Sensor including porous body with metal particles loaded in the pores of the body and measuring apparatus using the same
FUJIFILM CORP11 citations84
US7307731B2Dec 11, 2007
Method of detecting test bodies
FUJIFILM CORP10 citations84
US7224451B2May 29, 2007
Raman spectroscopy method, raman spectroscopy system and raman spectroscopy device
FUJIFILM CORP16 citations84
US7728289B2Jun 1, 2010
Mass spectroscopy device and mass spectroscopy system
FUJIFILM CORP18 citations83
US7551286B2Jun 23, 2009
Measurement apparatus
FUJIFILM CORP6 citations74
US10971129B2Apr 6, 2021
Soundproof structure, louver, and soundproof wall
FUJIFILM CORP2 citations73
US10676919B2Jun 9, 2020
Soundproof structure, louver, and partition
FUJIFILM CORP6 citations73
US10562337B2Feb 18, 2020
Autograph support device
FUJIFILM CORP2 citations73
US9728388B2Aug 8, 2017
Measurement device, measurement apparatus, and method
FUJIFILM CORP2 citations68
US10928912B2Feb 23, 2021
Visual sense and tactile sense integrated presentation device
FUJIFILM CORP0 citations63
US10864765B2Dec 15, 2020
Autograph support device
FUJIFILM CORP1 citations63
US10852767B2Dec 1, 2020
Handwriting support device
FUJIFILM CORP1 citations63
US8803105B2Aug 12, 2014
Optical field enhancement device
FUJIFILM CORP2 citations63
FUJI XEROX CO LTD
1 patentNAYA MASAYUKI
1 patentMATSUNAMI YUKI
1 patentShowing the top 50 of 85 patents by PatentIndex Score.