Inventor
BATUTIS DEVIN
US11 patents
Patents
11 patentsUS6684173B2Jan 27, 2004
System and method of testing non-volatile memory cells
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US10387281B2Aug 20, 2019
Flash memory block retirement policy
MICRON TECHNOLOGY INC10 citations83
US10325670B2Jun 18, 2019
Erase page check
MICRON TECHNOLOGY INC5 citations83
US10096380B1Oct 9, 2018
Erase page check
MICRON TECHNOLOGY INC7 citations83
US11437108B1Sep 6, 2022
Voltage bin calibration based on a temporary voltage shift offset
MICRON TECHNOLOGY INC5 citations73
US10824527B2Nov 3, 2020
Flash memory block retirement policy
MICRON TECHNOLOGY INC1 citations72
US11823748B2Nov 21, 2023
Voltage bin calibration based on a temporary voltage shift offset
MICRON TECHNOLOGY INC0 citations62
US11288149B2Mar 29, 2022
Flash memory block retirement policy
MICRON TECHNOLOGY INC0 citations62
US12106813B2Oct 1, 2024
Dynamic prioritization of selector VT scans
MICRON TECHNOLOGY INC0 citations61
US12124705B2Oct 22, 2024
Memory operation based on block-associated temperature
MICRON TECHNOLOGY INC0 citations51
US10685731B2Jun 16, 2020
Erase page check
MICRON TECHNOLOGY INC0 citations51