Inventor
PARK HEE-SOOK
KR71 patents
⚠️ This page may combine multiple inventors who share the name “PARK HEE-SOOK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
30 patentsUS6893915B2May 17, 2005
Semiconductor device having barrier layer between ruthenium layer and metal layer and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD84 citations98
US6277764B1Aug 21, 2001
Interlayered dielectric layer of semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD20 citations93
US6573147B2Jun 3, 2003
Method of forming a semiconductor device having contact using crack-protecting layer
SAMSUNG ELECTRONICS CO LTD19 citations92
US6485815B1Nov 26, 2002
Multi-layered dielectric layer including insulating layer having Si-CH3 bond therein and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD35 citations92
US9178039B2Nov 3, 2015
Semiconductor device
SAMSUNG ELECTRONICS CO LTD18 citations84
US7696552B2Apr 13, 2010
Semiconductor devices including high-k dielectric materials
SAMSUNG ELECTRONICS CO LTD12 citations84
US7521316B2Apr 21, 2009
Methods of forming gate structures for semiconductor devices
SAMSUNG ELECTRONICS CO LTD8 citations84
US7534709B2May 19, 2009
Semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD12 citations82
US7879707B2Feb 1, 2011
Semiconductor integrated circuit device and related method
SAMSUNG ELECTRONICS CO LTD6 citations74
US7718520B2May 18, 2010
Semiconductor integrated circuit device and related method
SAMSUNG ELECTRONICS CO LTD6 citations74
US7371669B2May 13, 2008
Method of forming a gate of a semiconductor device
SAMSUNG ELECTRONICS CO LTD7 citations74
US7279416B2Oct 9, 2007
Methods of forming a conductive structure in an integrated circuit device
SAMSUNG ELECTRONICS CO LTD7 citations74
US7223689B2May 29, 2007
Methods for forming a metal contact in a semiconductor device in which an ohmic layer is formed while forming a barrier metal layer
SAMSUNG ELECTRONICS CO LTD6 citations73
US7045842B2May 16, 2006
Integrated circuit devices having self-aligned contact structures
SAMSUNG ELECTRONICS CO LTD6 citations73
US6821572B2Nov 23, 2004
Method of cleaning a chemical vapor deposition chamber
SAMSUNG ELECTRONICS CO LTD10 citations73
US10103152B2Oct 16, 2018
Semiconductor device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD6 citations71
US11348938B2May 31, 2022
Methods of manufacturing a vertical memory device
SAMSUNG ELECTRONICS CO LTD2 citations66
US8034701B2Oct 11, 2011
Methods of forming recessed gate electrodes having covered layer interfaces
SAMSUNG ELECTRONICS CO LTD3 citations63
US7989333B2Aug 2, 2011
Methods of forming integrated circuit devices having anisotropically-oxidized nitride layers
SAMSUNG ELECTRONICS CO LTD2 citations63
US7875939B2Jan 25, 2011
Semiconductor device including an ohmic layer
SAMSUNG ELECTRONICS CO LTD2 citations63
US7772637B2Aug 10, 2010
Semiconductor devices including gate structures and leakage barrier oxides
SAMSUNG ELECTRONICS CO LTD3 citations63
US7759263B2Jul 20, 2010
Methods for fabricating improved gate dielectrics
SAMSUNG ELECTRONICS CO LTD5 citations63
US7582931B2Sep 1, 2009
Recessed gate electrodes having covered layer interfaces and methods of forming the same
SAMSUNG ELECTRONICS CO LTD3 citations63
US7582924B2Sep 1, 2009
Semiconductor devices having polymetal gate electrodes
SAMSUNG ELECTRONICS CO LTD6 citations63
US7550353B2Jun 23, 2009
Method of forming semiconductor device
SAMSUNG ELECTRONICS CO LTD6 citations63
US7544597B2Jun 9, 2009
Method of forming a semiconductor device including an ohmic layer
SAMSUNG ELECTRONICS CO LTD3 citations63
US7501673B2Mar 10, 2009
Semiconductor device multilayer structure, fabrication method for the same, semiconductor device having the same, and semiconductor device fabrication method
SAMSUNG ELECTRONICS CO LTD5 citations63
US7439176B2Oct 21, 2008
Semiconductor device multilayer structure, fabrication method for the same, semiconductor device having the same, and semiconductor device fabrication method
SAMSUNG ELECTRONICS CO LTD3 citations63
US7087519B2Aug 8, 2006
Method for forming contact having low resistivity using porous plug and method for forming semiconductor devices using the same
SAMSUNG ELECTRONICS CO LTD5 citations63
US7067417B2Jun 27, 2006
Methods of removing resistive remnants from contact holes using silicidation
SAMSUNG ELECTRONICS CO LTD2 citations63
SAMSUNG DISPLAY CO LTD
19 patentsUS11189226B2Nov 30, 2021
Display device
SAMSUNG DISPLAY CO LTD5 citations84
US11935488B2Mar 19, 2024
Display device
SAMSUNG DISPLAY CO LTD3 citations75
US11881165B2Jan 23, 2024
Display device
SAMSUNG DISPLAY CO LTD3 citations75
US11942016B2Mar 26, 2024
Display device and driving method thereof
SAMSUNG DISPLAY CO LTD1 citations73
US11450260B2Sep 20, 2022
Display device and driving method thereof
SAMSUNG DISPLAY CO LTD4 citations73
US11244596B2Feb 8, 2022
Display device and driving method thereof
SAMSUNG DISPLAY CO LTD3 citations73
US11127358B2Sep 21, 2021
Display device and displaying method thereof
SAMSUNG DISPLAY CO LTD2 citations73
US10276090B2Apr 30, 2019
Display device capable of correcting voltage drop and method for driving the same
SAMSUNG DISPLAY CO LTD2 citations72
US12431093B2Sep 30, 2025
Display device
SAMSUNG DISPLAY CO LTD0 citations63
US12412531B2Sep 9, 2025
Display device and method of driving the same
SAMSUNG DISPLAY CO LTD0 citations63
US12394356B2Aug 19, 2025
Display device and driving method thereof
SAMSUNG DISPLAY CO LTD0 citations63
US12327514B2Jun 10, 2025
Screen saver controller, display device including the same and method of operating a display device including the same
SAMSUNG DISPLAY CO LTD0 citations63
US11875732B2Jan 16, 2024
Screen saver controller, display device including the same and method of operating a display device including the same
SAMSUNG DISPLAY CO LTD0 citations63
US11875740B2Jan 16, 2024
Display device and method of driving the same
SAMSUNG DISPLAY CO LTD0 citations63
US11790849B2Oct 17, 2023
Display device and power setting method thereof
SAMSUNG DISPLAY CO LTD1 citations63
US11615730B2Mar 28, 2023
Display device performing peak luminance driving, and method of operating a display device
SAMSUNG DISPLAY CO LTD0 citations63
US11257412B2Feb 22, 2022
Display device performing peak luminance driving, and method of operating a display device
SAMSUNG DISPLAY CO LTD0 citations63
US11682362B2Jun 20, 2023
Afterimage compensator and display device having the same
SAMSUNG DISPLAY CO LTD0 citations62
US11094275B2Aug 17, 2021
Afterimage compensator and display device having the same
SAMSUNG DISPLAY CO LTD0 citations62
BAEK JONG-MIN
1 patentShowing the top 50 of 71 patents by PatentIndex Score.