P

Inventor

PARK HEE-SOOK

KR71 patents
⚠️ This page may combine multiple inventors who share the name “PARK HEE-SOOK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

30 patents
US6893915B2May 17, 2005

Semiconductor device having barrier layer between ruthenium layer and metal layer and method for manufacturing the same

SAMSUNG ELECTRONICS CO LTD84 citations98
US6277764B1Aug 21, 2001

Interlayered dielectric layer of semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD20 citations93
US6573147B2Jun 3, 2003

Method of forming a semiconductor device having contact using crack-protecting layer

SAMSUNG ELECTRONICS CO LTD19 citations92
US6485815B1Nov 26, 2002

Multi-layered dielectric layer including insulating layer having Si-CH3 bond therein and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD35 citations92
US9178039B2Nov 3, 2015

Semiconductor device

SAMSUNG ELECTRONICS CO LTD18 citations84
US7696552B2Apr 13, 2010

Semiconductor devices including high-k dielectric materials

SAMSUNG ELECTRONICS CO LTD12 citations84
US7521316B2Apr 21, 2009

Methods of forming gate structures for semiconductor devices

SAMSUNG ELECTRONICS CO LTD8 citations84
US7534709B2May 19, 2009

Semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD12 citations82
US7879707B2Feb 1, 2011

Semiconductor integrated circuit device and related method

SAMSUNG ELECTRONICS CO LTD6 citations74
US7718520B2May 18, 2010

Semiconductor integrated circuit device and related method

SAMSUNG ELECTRONICS CO LTD6 citations74
US7371669B2May 13, 2008

Method of forming a gate of a semiconductor device

SAMSUNG ELECTRONICS CO LTD7 citations74
US7279416B2Oct 9, 2007

Methods of forming a conductive structure in an integrated circuit device

SAMSUNG ELECTRONICS CO LTD7 citations74
US7223689B2May 29, 2007

Methods for forming a metal contact in a semiconductor device in which an ohmic layer is formed while forming a barrier metal layer

SAMSUNG ELECTRONICS CO LTD6 citations73
US7045842B2May 16, 2006

Integrated circuit devices having self-aligned contact structures

SAMSUNG ELECTRONICS CO LTD6 citations73
US6821572B2Nov 23, 2004

Method of cleaning a chemical vapor deposition chamber

SAMSUNG ELECTRONICS CO LTD10 citations73
US10103152B2Oct 16, 2018

Semiconductor device and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD6 citations71
US11348938B2May 31, 2022

Methods of manufacturing a vertical memory device

SAMSUNG ELECTRONICS CO LTD2 citations66
US8034701B2Oct 11, 2011

Methods of forming recessed gate electrodes having covered layer interfaces

SAMSUNG ELECTRONICS CO LTD3 citations63
US7989333B2Aug 2, 2011

Methods of forming integrated circuit devices having anisotropically-oxidized nitride layers

SAMSUNG ELECTRONICS CO LTD2 citations63
US7875939B2Jan 25, 2011

Semiconductor device including an ohmic layer

SAMSUNG ELECTRONICS CO LTD2 citations63
US7772637B2Aug 10, 2010

Semiconductor devices including gate structures and leakage barrier oxides

SAMSUNG ELECTRONICS CO LTD3 citations63
US7759263B2Jul 20, 2010

Methods for fabricating improved gate dielectrics

SAMSUNG ELECTRONICS CO LTD5 citations63
US7582931B2Sep 1, 2009

Recessed gate electrodes having covered layer interfaces and methods of forming the same

SAMSUNG ELECTRONICS CO LTD3 citations63
US7582924B2Sep 1, 2009

Semiconductor devices having polymetal gate electrodes

SAMSUNG ELECTRONICS CO LTD6 citations63
US7550353B2Jun 23, 2009

Method of forming semiconductor device

SAMSUNG ELECTRONICS CO LTD6 citations63
US7544597B2Jun 9, 2009

Method of forming a semiconductor device including an ohmic layer

SAMSUNG ELECTRONICS CO LTD3 citations63
US7501673B2Mar 10, 2009

Semiconductor device multilayer structure, fabrication method for the same, semiconductor device having the same, and semiconductor device fabrication method

SAMSUNG ELECTRONICS CO LTD5 citations63
US7439176B2Oct 21, 2008

Semiconductor device multilayer structure, fabrication method for the same, semiconductor device having the same, and semiconductor device fabrication method

SAMSUNG ELECTRONICS CO LTD3 citations63
US7087519B2Aug 8, 2006

Method for forming contact having low resistivity using porous plug and method for forming semiconductor devices using the same

SAMSUNG ELECTRONICS CO LTD5 citations63
US7067417B2Jun 27, 2006

Methods of removing resistive remnants from contact holes using silicidation

SAMSUNG ELECTRONICS CO LTD2 citations63

SAMSUNG DISPLAY CO LTD

19 patents
US11189226B2Nov 30, 2021

Display device

SAMSUNG DISPLAY CO LTD5 citations84
US11935488B2Mar 19, 2024

Display device

SAMSUNG DISPLAY CO LTD3 citations75
US11881165B2Jan 23, 2024

Display device

SAMSUNG DISPLAY CO LTD3 citations75
US11942016B2Mar 26, 2024

Display device and driving method thereof

SAMSUNG DISPLAY CO LTD1 citations73
US11450260B2Sep 20, 2022

Display device and driving method thereof

SAMSUNG DISPLAY CO LTD4 citations73
US11244596B2Feb 8, 2022

Display device and driving method thereof

SAMSUNG DISPLAY CO LTD3 citations73
US11127358B2Sep 21, 2021

Display device and displaying method thereof

SAMSUNG DISPLAY CO LTD2 citations73
US10276090B2Apr 30, 2019

Display device capable of correcting voltage drop and method for driving the same

SAMSUNG DISPLAY CO LTD2 citations72
US12431093B2Sep 30, 2025

Display device

SAMSUNG DISPLAY CO LTD0 citations63
US12412531B2Sep 9, 2025

Display device and method of driving the same

SAMSUNG DISPLAY CO LTD0 citations63
US12394356B2Aug 19, 2025

Display device and driving method thereof

SAMSUNG DISPLAY CO LTD0 citations63
US12327514B2Jun 10, 2025

Screen saver controller, display device including the same and method of operating a display device including the same

SAMSUNG DISPLAY CO LTD0 citations63
US11875732B2Jan 16, 2024

Screen saver controller, display device including the same and method of operating a display device including the same

SAMSUNG DISPLAY CO LTD0 citations63
US11875740B2Jan 16, 2024

Display device and method of driving the same

SAMSUNG DISPLAY CO LTD0 citations63
US11790849B2Oct 17, 2023

Display device and power setting method thereof

SAMSUNG DISPLAY CO LTD1 citations63
US11615730B2Mar 28, 2023

Display device performing peak luminance driving, and method of operating a display device

SAMSUNG DISPLAY CO LTD0 citations63
US11257412B2Feb 22, 2022

Display device performing peak luminance driving, and method of operating a display device

SAMSUNG DISPLAY CO LTD0 citations63
US11682362B2Jun 20, 2023

Afterimage compensator and display device having the same

SAMSUNG DISPLAY CO LTD0 citations62
US11094275B2Aug 17, 2021

Afterimage compensator and display device having the same

SAMSUNG DISPLAY CO LTD0 citations62

BAEK JONG-MIN

1 patent

Showing the top 50 of 71 patents by PatentIndex Score.