Inventor
FUNAHASHI NORIO
JP3 patents
Patents
3 patentsUS5086413AFeb 4, 1992
Non-volatile semiconductor memory device having an improved testing mode of operation and method of forming checkerwise test pattern in memory cell array
NEC CORP34 citations89
US6043749AMar 28, 2000
Frequency detection circuit
NEC CORP14 citations71
US6028335AFeb 22, 2000
Semiconductor device
NEC CORP12 citations71