P

Inventor

LEE KONG HEAN

SG11 patents

Patents

11 patents
US6228727B1May 8, 2001

Method to form shallow trench isolations with rounded corners and reduced trench oxide recess

CHARTERED SEMICONDUCTOR MFG142 citations97
US6350661B2Feb 26, 2002

Silicon nitride capped shallow trench isolation method for fabricating sub-micron devices with borderless contacts

CHARTERED SEMICONDUCTOR MFG49 citations95
US6265302B1Jul 24, 2001

Partially recessed shallow trench isolation method for fabricating borderless contacts

CHARTERED SEMICONDUCTOR MFG77 citations95
US6165871ADec 26, 2000

Method of making low-leakage architecture for sub-0.18 μm salicided CMOS device

CHARTERED SEMICONDUCTOR MFG55 citations95
US6297126B1Oct 2, 2001

Silicon nitride capped shallow trench isolation method for fabricating sub-micron devices with borderless contacts

CHARTERED SEMICONDUCTOR MFG20 citations92
US5956137ASep 21, 1999

In-line process monitoring using micro-raman spectroscopy

CHARTERED SEMICONDUCTOR MFG31 citations92
US6258676B1Jul 10, 2001

Method for forming a shallow trench isolation using HDP silicon oxynitride

CHARTERED SEMICONDUCTOR MFG37 citations91
US6010954AJan 4, 2000

Cmos gate architecture for integration of salicide process in sub 0.1 . .muM devices

CHARTERED SEMICONDUCTOR MFG41 citations91
US6410429B1Jun 25, 2002

Method for fabricating void-free epitaxial-CoSi2 with ultra-shallow junctions

CHARTERED SEMICONDUCTOR MFG33 citations90
US6649486B1Nov 18, 2003

Method to form shallow trench isolations

CHARTERED SEMICONDUCTOR MFG11 citations71
US6613648B1Sep 2, 2003

Shallow trench isolation using TEOS cap and polysilicon pullback

CHARTERED SEMICONDUCTOR MFG5 citations62